Author

Evgeny Vladimirovich Katuntsov

Observed names: E. V. Katuntsov, E.V. Katuntsov, Evgenii V. Katuntsov, Evgeniy Katuntsov, Evgeny V. Katuntsov, Е. V. Katuntsov

Institution: Saint Petersburg Mining University

Observed institution: Saint Petersburg Mining University

ORCID: 0000-0001-8345-0979

Observed ORCID: 0000-0001-8345-0979

OpenAlex ID: A5071422411

Снижение избыточности данных лазерного сканирования для построения цифровых моделей рельефа

2023 · A.A. Kochneva, E.V. Zaytseva, et al. · Modelirovanie, optimizaciâ i informacionnye tehnologii. · 2

Algorithm of Two-dimensional Images Matching by Contour Analysis Methods

2021 · SPMU, О. V. Kosarev, et al. · Vestnik of Ryazan State Radio Engineering University · 2

Reseaching of color distortion effects when applying adaptive histogram equalization methods to video frames from mines

2026 · Ekaterina Zaytseva, Alina Kochneva, et al. · Sustainable Development of Mountain Territories

Unsharp masking for improved quality images taken in mines

2025 · Ekaterina V. Zaytseva, Alina A. Kochneva, et al. · Mining Industry Journal (Gornay Promishlennost)

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Optimization of contrast enhancement in images obtained in mines

2025 · E. V. Zaitseva, A. A. Kochneva, et al. · Горный информационно-аналитический бюллетень (научно-технический журнал)

Assessment of the Influence of the Color Temperature of Radiation Sources on the Quality of Digital Images Obtained in Mines

2024 · Ekaterina V. Zaytseva, Alina A. Kochneva, et al. · IEEE International Conference on Problems of Informatics, Electronics and Radio Engineering (PIERE)

Application of the Least Squares Method in Calculations of Radiation Utilization Factors for Industrial Video Cameras Based on Large-Format CMOS Matrices

2024 · Ekaterina Viktorovna Zaytseva, Alina Alexandrovna Kochneva, et al. · International Conference on Actual Problems of Electron Devices Engineering

Development of Digital Image Processing in the Mining Industry

2024 · Ekaterina Viktorovna Zaytseva, Alina Alexandrovna Kochneva, et al. · International Conference on Actual Problems of Electron Devices Engineering

Works count: 8

Citation count: 4

H-index: 2

I10-index: