Author

Ulrich Abelein

Observed names: Abelein, Ulrich, U. Abelein

Institution: Infineon Technologies (Germany)

Observed institutions: Audi (Germany), Infineon Technologies (Germany), Universität der Bundeswehr München, Bundeswehr

OpenAlex ID: A5072022544

Complexity, quality and robustness - the challenges of tomorrow's automotive electronics

2012 · U. Abelein, H. Lochner, et al. · Design, Automation, and Test in Europe · 67

Improved Reliability by Reduction of Hot-Electron Damage in the Vertical Impact-Ionization MOSFET (I-MOS)

2007 · Ulrich Abelein, Mathias Born, et al. · IEEE Electron Device Letters · 50

A Novel Vertical Impact Ionisation MOSFET (I-MOS) Concept

2006 · U. Abelein, M. Born, et al. · IEEE International Conference on Microelectronics (MIEL) · 30

Advanced Diagnosis

2014 · Felix Reimann, Michael Glaß, et al. · ACM/IEEE Design Automation Conference (DAC) · 29

Doping profile dependence of the vertical impact ionization MOSFET’s (I-MOS) performance

2007 · Ulrich Abelein, Andreas Assmuth, et al. · Solid-State Electronics · 29

Structural In-Field Diagnosis for Random Logic Circuits

2011 · Alejandro Cook, Melanie Elm, et al. · IEEE European Test Symposium (ETS) · 22

Vertical 40 nm Impact Ionization MOSFET (I-MOS) for high temperature applications

2008 · U. Abelein, A. Assmuth, et al. · IEEE International Conference on Microelectronics (MIEL) · 19

Non-intrusive integration of advanced diagnosis features in automotive E/E-architectures

2014 · Ulrich Abelein, Alejandro Cook, et al. · Design, Automation, and Test in Europe · 10

The Impact Ionization MOSFET (IMOS) as low-voltage optical detector

2010 · M. Schlosser, P. Iskra, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 10

Sub-50 nm high performance PDBFET with impact ionization

2005 · M. Born, U. Abelein, et al. · Thin Solid Films · 8

Evaluation of effective stress times and stress levels from mission profiles for semiconductor reliability

2017 · A. Hirler, J. Biba, et al. · Microelectronics Reliability · 6

Considering diagnosis functionality during automatic system-level design of automotive networks

2012 · Michael Eberl, Michael Glaß, et al. · ACM/IEEE Design Automation Conference (DAC) · 6

Mission Profile Clustering Using a Universal Quantile Criterion

2022 · A. Hirler, U. Abelein, et al. · IEEE International Reliability Physics Symposium proceedings · 4

Epitaxy — A way to novel field effect devices

2008 · Torsten Sulima, Ulrich Abelein, et al. · Thin Solid Films · 2

Works count: 19

Citation count: 296

H-index: 9

I10-index: 9