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Dowook Kim
Observed name:
KIM, DOWOOK
Institution:
Pohang University of Science and Technology
Observed institution:
Pohang University of Science and Technology
ORCID:
0000-0002-2215-4428
Observed ORCID:
0000-0002-2215-4428
OpenAlex ID:
A5072120443
Flat‐Band Electronic Bipolarity in a Janus and Kagome van der Waals Semiconductor Nb 3 TeI 7
2025
·
Jo Hyun Yun
, Minki Sung
, et al.
·
Advanced Materials
·
7
Thickness dependent charge density wave networks on thin 1T-TaS$$_2$$
2023
·
Wooin Yang
, Dowook Kim
, et al.
·
Journal of the Korean Physical Society
·
5
PDF
In-situ scanning tunneling microscopy observation of thickness-dependent air-sensitive layered materials and heterodevices
2023
·
Hyoung Kug Kim
, Dowook Kim
, et al.
·
Journal of the Korean Physical Society
·
5
PDF
Comment on “Tunneling-tip-induced collapse of the charge gap in the excitonic insulator Ta 2 NiSe 5 ”
2024
·
Dowook Kim
, So Young Kim
, et al.
·
Physical Review Research
·
2
Observation of Excitonic Instability in a Monolayer Ta 2 NiSe 5 With Strain Disorder
2026
·
So Young Kim
, Kwangrae Kim
, et al.
·
Advanced Science
Electric-field-driven subsurface atomic migration in van der Waals bilayer $$\textrm{Ta}_{2}\textrm{NiSe}_{5}$$ via scanning tunneling microscopy
2025
·
Dowook Kim
, So Young Kim
, et al.
·
Journal of the Korean Physical Society
Scanning tunneling microscopy study of hidden phases in atomically thin 1T-TaS$$_2$$
2023
·
Wooin Yang
, Dowook Kim
, et al.
·
Journal of the Korean Physical Society
PDF
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Works count:
8
Citation count:
19
H-index:
3
I10-index:
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