X. R. Wang
Observed names: C. Wang, Chen Wang, Wang X. R., Wang Xiang-Rong, Wang, C., Wang, X. R., Wang, Xiang Rong, Wang, Xiang-Rong, Wang, Xiangrong, X R Wang, X. R Wang, X. R. WANG, X. S. Wang, X. Wang, X.R Wang, X.R. WANG, X.R. Wang, X. R. Wang, Xiang Rong Wang, Xiang Wang, Xiang-Rong Wang, Xiangrong Wang, Xiang‐Rong Wang, Y.Q. Wang
Institutions: Tianjin University, Chinese University of Hong Kong, Shenzhen
Observed institutions: Oklahoma State University, University of Science and Technology of China, Argonne National Laboratory, Oak Ridge National Laboratory, University of Minnesota, University of Electronic Science and Technology of China, Shandong University, Tianjin University, Hunan University, Technion – Israel Institute of Technology, Carestream (United States), Chinese University of Hong Kong, Chinese Academy of Sciences, Hong Kong University of Science and Technology, Norwegian University of Science and Technology, Wuhan University, HKUST Shenzhen Research Institute, Chinese University of Hong Kong, Shenzhen, Institute of Semiconductors, Institute of Solid State Physics, Kodak (United States), Institute of Physics, State Key Laboratory of Electronic Thin Films and Integrated Devices, State Key Laboratory of Crystal Materials, University of Rochester, Massachusetts Institute of Technology, The University of Texas at Austin
ORCID: 0000-0002-8600-3258
Observed ORCIDs: 0000-0002-8600-3258, 0000-0002-1740-578X
OpenAlex ID: A5072352909
