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E. El Allam
Observed name:
E El Allam
Institution:
Sidi Mohamed Ben Abdellah University
Observed institution:
Sidi Mohamed Ben Abdellah University
ORCID:
0000-0001-8420-4606
Observed ORCID:
0000-0001-8420-4606
OpenAlex ID:
A5072396444
Gamma non-ionizing energy loss: Comparison with the damage factor in silicon devices
2018
·
E. El Allam
, C. Inguimbert
, et al.
·
Journal of Applied Physics
·
28
Gamma and Electron NIEL Dependence of Irradiated GaAs
2017
·
E. El Allam
, C. Inguimbert
, et al.
·
IEEE Transactions on Nuclear Science
·
18
NIEL calculations for estimating the displacement damage introduced in GaAs irradiated with charged particles
2017
·
E El Allam
, C Inguimbert
, et al.
·
IOP Conference Series Materials Science and Engineering
·
9
PDF
ガンマ非イオン化エネルギー損失:シリコンデバイスにおける損傷因子との比較【jst・京大機械翻訳】
2018
·
E El Allam
, C Inguimbert
, et al.
·
Journal of Applied Physics
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Works count:
4
Citation count:
55
H-index:
3
I10-index:
2
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