Author

Christopher Stumm

Observed names: C. Stumm, Stumm, Christopher
ORCID: 0000-0002-1611-3873
Observed ORCID: 0000-0002-1611-3873
OpenAlex ID: A5072428038
2018 · Hai Zhang, Stefano Sfarra, et al. · IEEE Transactions on Industrial Informatics · 51
2018 · Hai Zhang, Stefano Sfarra, et al. · IEEE Transactions on Industrial Informatics · 23
2013 · Stefan Scholl, Christopher Stumm, et al. · IEEE AFRICON · 21
2012 · G. Walle, U. Netzelmann, et al. · International Conference on Quantitative InfraRed Thermography (QIRT) · 11
2024 · Frank Leinenbach, Christopher Stumm, et al. · Journal of sensors and sensor systems · 8
2018 · Christopher Stumm, Klaus Szielasko, et al. · Materials Today Communications · 5
2018 · Hai Zhang, Stefano Sfarra, et al. · Conference proceedings - Canadian Conference on Electrical and Computer Engineering · 2
2025 · Frank Leinenbach, Christopher Stumm, et al. · Springer eBooks · 1
2018 · H. Zhang, S. Sfarra, et al. · International Conference on Quantitative InfraRed Thermography (QIRT) · 1
2025 · Frank Leinenbach, Christopher Stumm, et al. · Springer eBooks
2013 · Christopher Stumm, Christian Brugger, et al. · Publication Server of Kaiserslautern University of Technology (Kaiserslautern University of Technology)
Works count: 20
Citation count: 144
H-index: 6
I10-index: 5
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