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Francesco Pintacuda

Observed names: Dr Francesco Pintacuda, F. Pintacuda
Observed institution: STMicroelectronics (Italy)
OpenAlex ID: A5073213957
Heavy Ion Induced Degradation in SiC Schottky Diodes: Bias and Energy Deposition Dependence
2016 · Arto Javanainen, Kenneth F. Galloway, et al. · IEEE Transactions on Nuclear Science · 98
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Heavy Ion Induced Degradation in SiC Schottky Diodes: Incident Angle and Energy Deposition Dependence
2017 · Arto Javanainen, Marek Turowski, et al. · IEEE Transactions on Nuclear Science · 56
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Charge Transport Mechanisms in Heavy-Ion Driven Leakage Current in Silicon Carbide Schottky Power Diodes
2016 · Arto Javanainen, Kenneth F. Galloway, et al. · IEEE Transactions on Device and Materials Reliability · 35
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Accelerated Tests on Si and SiC Power Transistors with Thermal, Fast and Ultra-Fast Neutrons
2020 · Fabio Principato, Saverio Altieri, et al. · Sensors · 25
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Statistical Analysis of Heavy-Ion Induced Gate Rupture in Power MOSFETs—Methodology for Radiation Hardness Assurance
2012 · V. Ferlet-Cavrois, C. Binois, et al. · IEEE Transactions on Nuclear Science · 23
Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs Lifetime by Reliability Tests
2021 · Fabio Principato, Giuseppe Allegra, et al. · Sensors · 13
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SEGR in SiO${}_2$–Si$_3$N$_4$ Stacks
2014 · Arto Javanainen, Veronique Ferlet-Cavrois, et al. · IEEE Transactions on Nuclear Science · 13
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SEGR and PIGS Failure Analysis of SiC Mosfet
2019 · F. Pintacuda, S. Massett, et al. · European Space Power Conference (ESPC) · 12
Semi-Empirical Model for SEGR Prediction
2013 · Arto Javanainen, Veronique Ferlet-Cavrois, et al. · IEEE Transactions on Nuclear Science · 11
Impact of Temperature on Neutron Irradiation Failure-in-Time of Silicon and Silicon Carbide Power MOSFETs
2023 · Fabio Principato, Carlo Cazzaniga, et al. · Radiation · 6
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Incident angle effect on heavy ion induced reverse leakage current in SiC Schottky diodes
2016 · Arto Javanainen, Kenneth F. Galloway, et al. · European Conference on Radiation and Its Effects on Components and Systems · 6
Prototyping and characterization of radiation hardened SiC MOS structures
2019 · Francesco Pintacuda, Vincenzo Cantarella, et al. · European Space Power Conference (ESPC) · 5
Impact of neutron irradiation on SiC power MOSFETs after stress tests qualification
2023 · Francesco Pintacuda, G. Allegra, et al. · Microelectronics Reliability · 3
The "Livio Scarsi" X-Ray Facility at University of Palermo for Device Testing
2015 · F. Principato, G. Gerardi, et al. · European Conference on Radiation and Its Effects on Components and Systems · 3
Enhanced Low Dose Rate Sensitivity Analysis of Vertical BJT-STMicroelectronics
2015 · Francesco Pintacuda, Marc Poizat, et al. · European Conference on Radiation and Its Effects on Components and Systems · 2
TID test results of radiation hardened SiC MOS structures pre-temperature stressed
2019 · F. Pintacuda, S. Massetti, et al. · European Space Power Conference (ESPC) · 1
SEE Responses of Mos-SIC, Mos-si and Sic Mosfet
2019 · F. Pintacuda, S. Massetti, et al. · European Conference on Radiation and Its Effects on Components and Systems · 1
TID test results of radiation hardened SiC MOS structures
2019 · V. Cantarella, F. Pintacuda, et al. · European Conference on Radiation and Its Effects on Components and Systems · 1
SEGR in SiO2-Si3N4 stacks
2013 · Arto Javanainen, Veronique Ferlet-Cavrois, et al. · European Conference on Radiation and Its Effects on Components and Systems · 1
New RAD-Hard STRH3260L6 Bipolar And STRH100N10 Mosfet Power Transistors
2011 · Giuseppe Camonita, Francesco Pintacuda · 1
Multi-technique characterizations of single-event burnout (SEB) in silicon carbide (SiC) power MOSFETs
2026 · Francesco Pintacuda, Fabio Principato, et al. · The European Physical Journal Plus
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Temperature Dependence of Neutron Interaction with SiC power MOSFETs
2023 · Francesco Pintacuda, Carlo Cazzaniga, et al. · RADECS Data Workshop
Temperature Dependence of Terrestrial Neutron Induced Failures in Commercial Silicon and Silicon Carbide Power MOSFETs
2022 · Fabio Principato, Carlo Cazzaniga, et al. · European Conference on Radiation and Its Effects on Components and Systems
ST Rad-Hard Power Bipolar Transistors Product Portfolio
2011 · Giuseppe Camonita, Francesco Pintacuda · ESASP
A New Self-Heating Bipolar Transistor Spice Model
2011 · Francesco Pintacuda, Daniela Cavallaro, et al.
Works count: 30
Citation count: 317
H-index: 9
I10-index: 9
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