Author

S. Merle

Observed names: S Merle, Sandrine Merle

Institutions: Centre National de la Recherche Scientifique, Institut Pascal, Université Blaise Pascal

Observed institutions: Centre National de la Recherche Scientifique, Institut Pascal, Université Blaise Pascal

OpenAlex ID: A5073993265

Passivation of III-V compounds used for metal-insulator-InP(100) structures

1998 · L. Bideux, S. Merle, et al. · Surface and Interface Analysis · 5

Angular distribution of electrons elastically reflected from polycrystalline metals (Pd, In)

2000 · C. Robert, S. Zuber, et al. · Surface and Interface Analysis · 4

Some applications of elastic peak electron spectroscopy for semiconductor surface studies

1998 · L. Bideux, C. Robert, et al. · Surface and Interface Analysis · 4

Effect of InSb buffer layer in MIS structures based on InP

2001 · S Tizi, Z Benamara, et al. · Vacuum · 3

UHV aluminium oxide on silicon substrates: electron spectroscopies analysis and electrical measurements

2001 · B Gruzza, S Merle, et al. · Applied Surface Science · 2

Realisation de structures metal/isolant/semi-conducteur. Etude par spectroscopies electroniques et caracterisations electriques

1999 · Sandrine Merle

Works count: 6

Citation count: 18

H-index: 3

I10-index: