Author

Charles E. Jowett

Observed names: C. E. Jowett, C.E. JOWETT, C.E. Jowett, Charles Jowett, Jowett, C. E., (Charles Eric)

OpenAlex ID: A5074128040

Electrostatics in the Electronics Environment

1976 · Charles E. Jowett · 29

Materials in electronics

1971 · C.E. JOWETT · 25

The Engineering of Microelectronic Thin and Thick Films

1976 · C. E. Jowett · 4

Materials and processes in electronics

1982 · C.E. JOWETT · 2

Surface analytical techniques applied to electronic components

1980 · Charles E. Jowett · Microelectronics Journal · 2

Semiconductor Devices: Testing and Evaluation

1974 · C.E. JOWETT · 2

Reliability in the electronics manufacturing phase

1976 · Charles Jowett · Microelectronics Reliability · 1

Thin-Film Techniques for Microwave Integrated Circuits

1976 · C. E. Jowett · 1

Effects of static electrification on MOS devices

1976 · Charles E. Jowett · 1

Protection from static electricity

1976 · Charles E. Jowett · 1

Thick-Film Resistor Inks

1976 · C. E. Jowett · 1

Static electrification hazards in microelectronics production

1974 · C.E. Jowett · Microelectronics Reliability · 1

Electronic engineering processes

1972 · C.E. JOWETT · 1

Guest editorial

1971 · C.E. Jowett · Microelectronics Reliability · 1

Reliable electronic assembly production

1970 · C.E. JOWETT · 1

Guest editorial

1986 · Charles E. Jowett · Microelectronics Reliability

Book Review

1981 · Charles Jowett · Microelectronics Journal

Book Review

1981 · Charles Jowett · Microelectronics Journal

Reliability engineering in microelectronics

1978 · C.E. Jowett · Microelectronics Reliability

In-built failure environments

1976 · C.E. Jowett · Microelectronics Reliability

Load Life of Thick-Film Resistors

1976 · C. E. Jowett

Photoetching and Screen-Printing Conductor Patterns

1976 · C. E. Jowett

Components Compatible with Thick-Film Hybrids

1976 · C. E. Jowett

Thick-Film Microcircuit Production

1976 · C. E. Jowett

Static at dielectrics and materials interfaces

1976 · Charles E. Jowett

Works count: 65

Citation count: 73

H-index: 3

I10-index: 2