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Author

Toufik Bentrcia

Observed name: T. Bentrcia
ORCID: 0000-0001-8069-314X
Observed ORCID: 0000-0001-8069-314X
OpenAlex ID: A5074477100
Machine Learning-Based Condition Monitoring for PV Systems: State of the Art and Future Prospects
2021 · Tarek Berghout, Mohamed Benbouzid, et al. · Energies · 76
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Improved analog and RF performances of gate-all-around junctionless MOSFET with drain and source extensions
2015 · F. Djeffal, H. Ferhati, et al. · Superlattices and Microstructures · 55
Federated Learning for Condition Monitoring of Industrial Processes: A Review on Fault Diagnosis Methods, Challenges, and Prospects
2022 · Tarek Berghout, Mohamed Benbouzid, et al. · Electronics · 51
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A Semi-Supervised Deep Transfer Learning Approach for Rolling-Element Bearing Remaining Useful Life Prediction
2021 · Tarek Berghout, Leila-Hayet Mouss, et al. · IEEE Transactions on Energy Conversion · 51
Improved analog/RF performance of double gate junctionless MOSFET using both gate material engineering and drain/source extensions
2016 · E. Chebaki, F. Djeffal, et al. · Superlattices and Microstructures · 50
The role of the Ge mole fraction in improving the performance of a nanoscale junctionless tunneling FET: concept and scaling capability
2018 · Hichem Ferhati, Fayçal Djeffal, et al. · Beilstein Journal of Nanotechnology · 40
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A Comparative Study on Scaling Capabilities of Si and SiGe Nanoscale Double Gate Tunneling FETs
2019 · Toufik Bentrcia, Fayçal Djeffal, et al. · Silicon · 38
A deep supervised learning approach for condition-based maintenance of naval propulsion systems
2020 · Tarek Berghout, Leïla-Hayet Mouss, et al. · Ocean Engineering · 36
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Continuous analyticI—Vmodel for GS DG MOSFETs including hot-carrier degradation effects
2012 · Toufik Bentrcia, Faycal Djeffal, et al. · Journal of Semiconductors · 34
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Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effects
2010 · F. Djeffal, T. Bentrcia, et al. · Microelectronics Reliability · 27
Auto-NAHL: A Neural Network Approach for Condition-Based Maintenance of Complex Industrial Systems
2021 · Tarek Berghout, Mohamed Benbouzid, et al. · IEEE Access · 23
An analytical two dimensional subthreshold behavior model to study the nanoscale GCGS DG Si MOSFET including interfacial trap effects
2012 · T. Bentrcia, F. Djeffal, et al. · Microelectronics Reliability · 21
A Neural Network Weights Initialization Approach for Diagnosing Real Aircraft Engine Inter-Shaft Bearing Faults
2023 · Tarek Berghout, Toufik Bentrcia, et al. · Machines · 20
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Impact of the drain and source extensions on nanoscale Double-Gate Junctionless MOSFET analog and RF performances
2015 · T. Bentrcia, F. Djeffal, et al. · Materials Science in Semiconductor Processing · 19
Impact of deposition methods and doping on structural, optical and electrical properties of ZnO-Al thin films
2019 · A. Zaiour, A. Benhaya, et al. · Optik · 15
Two‐dimensional numerical analysis of nanoscale junctionless and conventional Double Gate MOSFETs including the effect of interfacial traps
2012 · Elasaad Chebaki, Fayçal Djeffal, et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 15
On the solution behavior of a nonlinear time-fractional Klein–Gordon equation: Theoretical study and numerical validation
2023 · Toufik Bentrcia, Abdelaziz Mennouni · Communications in Nonlinear Science and Numerical Simulation · 11
On the asymptotic stability of a Bresse system with two fractional damping terms: Theoretical and numerical analysis
2022 · Toufik Bentrcia, Abdelaziz Mennouni · Discrete and Continuous Dynamical Systems - B · 11
A Heterogeneous Federated Transfer Learning Approach with Extreme Aggregation and Speed
2022 · Tarek Berghout, Toufik Bentrcia, et al. · Mathematics · 10
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New fusion and selection approaches for estimating the remaining useful life using Gaussian process regression and induced ordered weighted averaging operators
2020 · Mohammed Bouzenita, Leila‐Hayet Mouss, et al. · Quality and Reliability Engineering International · 10
New junctionless RADFET dosimeter design for low‐cost radiation monitoring applications
2013 · Djemai Arar, Fayçal Djeffal, et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 10
An Explicit Continuous Analytical Model for Gate All Around (GAA) MOSFETs Including the Hot-Carrier Degradation Effects
2011 · M. A. Abdi, F. Djeffal, et al. · Journal of Nanoscience and Nanotechnology · 10
Numerical Investigation of the SiGe/Si Heterostructure Including Interfacial Defects for Photovoltaic Applications
2013 · K. Kacha, F. Djeffal, et al. · Advanced materials research · 9
Exposing Deep Representations to a Recurrent Expansion with Multiple Repeats for Fuel Cells Time Series Prognosis
2022 · Tarek Berghout, Mohamed Benbouzid, et al. · Entropy · 8
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New fusion frameworks including explicit weighting functions for the remaining useful life prognostics
2021 · Mohammed Bouzenita, Leïla-Hayet Mouss, et al. · Expert Systems with Applications · 8
Works count: 74
Citation count: 745
H-index: 15
I10-index: 22
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