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Wayne Harlow
Observed name:
W. Harlow
Institution:
Micron (United States)
Observed institutions:
Micron (United States),
University of Dhaka,
Drexel University
OpenAlex ID:
A5074508798
In situ environmental transmission electron microscopy study of oxidation of two-dimensional Ti 3 C 2 and formation of carbon-supported TiO 2
2014
·
H. Ghassemi
, W. Harlow
, et al.
·
Journal of Materials Chemistry A
·
378
Tracking the evolution of intergranular corrosion through twin-related domains in grain boundary networks
2018
·
Christopher M. Barr
, Sebastian Thomas
, et al.
·
npj Materials Degradation
·
59
PDF
Thermal desorption spectroscopy of high fluence irradiated ultrafine and nanocrystalline tungsten: helium trapping and desorption correlated with morphology
2017
·
O. El-Atwani
, C.N. Taylor
, et al.
·
Nuclear Fusion
·
35
Determination of the initial oxidation behavior of Zircaloy-4 by in-situ TEM
2016
·
Wayne Harlow
, Hessam Ghassemi
, et al.
·
Journal of Nuclear Materials
·
20
Thickness-dependent stabilization of tetragonal ZrO2 in oxidized zirconium
2017
·
Wayne Harlow
, Andrew C. Lang
, et al.
·
Scripta Materialia
·
19
In-situ TEM study of the Corrosion Behavior of Zry-4
2014
·
Wayne Harlow
, Hessam Ghassemi
, et al.
·
Microscopy and Microanalysis
·
4
PDF
Toward 3D imaging of corrosion at the nanoscale: Cross-sectional analysis of in-situ oxidized TEM samples
2019
·
Wayne Harlow
, Mitra L. Taheri
·
Micron
·
2
First order correction of EELS measurements based on experimental ADF imaging
2022
·
Yougui Liao
, Rob Goodwin
, et al.
·
IEEE Workshop on Microelectronics and Electron Devices (WMED)
·
1
In-situ TEM Study of the Initial Oxidation Behavior of Zry-4
2015
·
Wayne Harlow
, Mitra L. Taheri
·
Microscopy and Microanalysis
·
1
PDF
The Perfect Cut: Focused Ion Beam Preparation for In Situ TEM
2015
·
Andrew Lang
, Wayne Harlow
, et al.
·
Microscopy and Microanalysis
·
1
PDF
Pluck-and-Probe Method for EBIRCH Isolation of Wordline Defects in 3D Replacement Gate NAND
2024
·
Chandler Rich
, Wayne Harlow
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
Electron Beam Induced Resistance Change for Isolation of Wordline Shorts in 3D Replacement Gate NAND
2023
·
Chandler Rich
, Wayne Harlow
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
The development of an in-situ TEM technique for studying corrosion behavior as applied to zirconium-based alloys
2017
·
Wayne Harlow
, Mitra Taheri
In Situ TEM Investigation on the Effect of Atmosphere on Anatase-To-Rutile Phase Transformation
2013
·
H. Ghassemi
, W. Harlow
, et al.
·
Microscopy and Microanalysis
PDF
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Works count:
14
Citation count:
520
H-index:
5
I10-index:
5
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