Author

Ki-Nam Joo

Observed names: Joo Kinam, Joo, K, Joo, K.N. (author), Joo, Ki-Nam, K. N. Joo, K.-N. Joo, KN Joo, Ki-Nam JOO, Ki-nam Joo, Kinam Joo

Institution: Chosun University

Observed institutions: Lawrence Livermore National Laboratory, University of Arizona, Chosun University, Korea Advanced Institute of Science and Technology, Mitutoyo Corporation (Japan), Delft University of Technology

ORCID: 0000-0001-9484-2644

Observed ORCID: 0000-0001-9484-2644

OpenAlex ID: A5074703606

Absolute distance measurement by dispersive interferometry using a femtosecond pulse laser

2006 · Ki-Nam Joo, Seung-Woo Kim · Optics Express · 307

Distance measurements by combined method based on a femtosecond pulse laser

2008 · Ki-Nam Joo, Yunseok Kim, et al. · Optics Express · 123

High resolution heterodyne interferometer without detectable periodic nonlinearity

2010 · Ki-Nam Joo, Jonathan D. Ellis, et al. · Optics Express · 95

Simple heterodyne laser interferometer with subnanometer periodic errors

2009 · Ki-Nam Joo, Jonathan D. Ellis, et al. · Optics Letters · 63

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Refractive index measurement by spectrally resolved interferometry using a femtosecond pulse laser

2007 · Ki-Nam Joo, Seung-Woo Kim · Optics Letters · 55

A compact high-precision periodic-error-free heterodyne interferometer

2020 · Ki-Nam Joo, Erin Clark, et al. · Journal of the Optical Society of America A · 33

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Low cost wafer metrology using a NIR low coherence interferometry

2013 · Young Gwang Kim, Yong Bum Seo, et al. · Optics Express · 28

High-speed combined NIR low-coherence interferometry for wafer metrology

2017 · Hyo Mi Park, Ki-Nam Joo · Applied Optics · 26

Subaperture stitching wavelength scanning interferometry for 3D surface measurement of complex-shaped optics

2020 · Yong Bum Seo, Ki-Nam Joo, et al. · Measurement Science and Technology · 23

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Single-shot freeform surface profiler

2020 · Yong Bum Seo, Hyo Bin Jeong, et al. · Optics Express · 23

Single-Shot Imaging of Two-Wavelength Spatial Phase-Shifting Interferometry

2019 · Jun Woo Jeon, Ki-Nam Joo · Sensors · 23

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Flexible lateral shearing interferometry based on polarization gratings for surface figure metrology

2022 · Hyo Bin Jeong, Hyo Mi Park, et al. · Optics and Lasers in Engineering · 22

Vision chromatic confocal sensor based on a geometrical phase lens

2021 · Hyo Mi Park, Uihyeok Kwon, et al. · Applied Optics · 19

Dual low coherence scanning interferometry for rapid large step height and thickness measurements

2016 · Hyo Mi Park, Hee Won Jung, et al. · Optics Express · 19

3D multi-layered film thickness profile measurements based on photometric type imaging ellipsometry

2016 · Yong Bum Seo, Young Ho Yun, et al. · International Journal of Precision Engineering and Manufacturing · 19

Optical interferometric approach for measuring the geometrical dimension and refractive index profiles of a double-sided polished undoped Si wafer

2014 · Ho-Jae Lee, Ki-Nam Joo · Measurement Science and Technology · 19

Frequency stabilized three mode HeNe laser using nonlinear optical phenomena

2010 · Jonathan D. Ellis, Ki-Nam Joo, et al. · Optics Express · 19

High-speed polarized low coherence scanning interferometry based on spatial phase shifting

2019 · Jun Woo Jeon, Hee Won Jeong, et al. · Applied Optics · 18

Dichroic spectrally-resolved interferometry to overcome the measuring range limit

2015 · Ki-Nam Joo · Measurement Science and Technology · 18

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SPARSE (spatially phase-retarded spectroscopic ellipsometry) for real-time film analysis

2017 · Dae Hee Kim, Young Ho Yun, et al. · Optics Letters · 17

Single-shot spectrally resolved interferometry for the simultaneous measurement of the thickness and surface profile of multilayer films

2021 · Young-Sik Ghim, Yong Bum Seo, et al. · Optics Express · 16

Minimization of spectral phase errors in spectrally resolved white light interferometry by the iterative least-squared phase-shifting method

2012 · Joonho You, Ki-Nam Joo · Measurement Science and Technology · 14

Recent Progress on Optical Tomographic Technology for Measurements and Inspections of Film Structures

2022 · Ki-Nam Joo, Hyo-Mi Park · Micromachines · 13

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Elimination of the direction ambiguity and the dead zone in spectrally resolved interferometry

2016 · Young Ho Yun, Yong Bum Seo, et al. · Measurement Science and Technology · 12

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A multi-channel fiber optic proximity sensor

2016 · Byeong Kwon Kim, Ki-Nam Joo · Measurement Science and Technology · 12

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Works count: 127

Citation count: 1,261

H-index: 18

I10-index: 32