Author

Sebastian Ehn

Observed names: S Ehn, S. Ehn
Observed institution: Technical University of Munich
OpenAlex ID: A5075169635
2018 · Thorsten Sellerer, Peter B. Noël, et al. · European Radiology · 150
2017 · Korbinian Mechlem, Sebastian Ehn, et al. · IEEE Transactions on Medical Imaging · 98
2017 · Sebastian Ehn, Thorsten Sellerer, et al. · Journal of Applied Clinical Medical Physics · 86
2018 · Felix K. Kopp, Heiner Daerr, et al. · Scientific Reports · 74
2018 · Kai Mei, Sebastian Ehn, et al. · European Radiology Experimental · 42
2018 · Korbinian Mechlem, Thorsten Sellerer, et al. · IEEE Transactions on Medical Imaging · 23
2016 · J. Meiser, M. Willner, et al. · Journal of X-Ray Science and Technology · 22
2014 · Franz M. Epple, Franz Pfeiffer, et al. · IEEE Transactions on Medical Imaging · 22
2017 · Korbinian Mechlem, Sebastian Allner, et al. · Biomedical Physics & Engineering Express · 16
2019 · Andreas P. Sauter, Johannes Hammel, et al. · Scientific Reports · 11
2016 · Sebastian Ehn, Franz Michael Epple, et al. · Biomedical Optics Express · 11
2020 · A Sauter, J Hammel, et al. · RöFo - Fortschritte auf dem Gebiet der Röntgenstrahlen und der bildgebenden Verfahren
2018 · Kai Mei, Benedikt J. Schwaiger, et al. · SPIE Medical Imaging: Physics of Medical Imaging
2017 · Konstantin Willer, Kai Scherer, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
2017 · Korbinian Mechlem, Sebastian Ehn, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
2017 · Thorsten Sellerer, Sebastian Ehn, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Works count: 24
Citation count: 867
H-index: 16
I10-index: 18
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