Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Tom Vandeplas
Observed name:
Vandeplas Tom
Institution:
Keysight Technologies (United Kingdom)
Observed institutions:
Keysight Technologies (United States),
Keysight Technologies (United Kingdom)
OpenAlex ID:
A5075491932
Measurement-based parameter identification of non-linear polynomial frequency domain model of single-phase four diode bridge rectifier
2017
·
Markus Mirz
, Robert Uhl
, et al.
·
IEEE International Instrumentation and Measurement Technology Conference
·
8
Non-linear behavioral X-Parameters model of single-phase rectifier in the frequency domain
2016
·
Robert Uhl
, Markus Mirz
, et al.
·
Annual Conference of the IEEE Industrial Electronics Society (IECON)
·
8
Digital twin creation and residual analysis using CLEAN for radar target emulation
2026
·
Arvid Sims
, Bernhard Holzinger
, et al.
·
International Journal of Microwave and Wireless Technologies
PDF
周波数領域における単相整流器の非線形行動Xパラメータモデル【Powered by NICT】
2016
·
Robert Uhl
, Markus Mirz
, et al.
·
IEEE Conference Proceedings
TokenNets: An Approach to Programming Highly Parallel Measurement Science and Signal Processing
2010
·
Lee Barford
, Kevin Mitchell
, et al.
Show more works
View as search
Works count:
5
Citation count:
16
H-index:
2
I10-index:
Year
Topic
Type
