Get started
Author

Teresa Partida Manzanera

Observed names: Partida Manzanera, T, Partida Manzanera, Teresa, Partida Manzanera, teresa, Partida, Teresa, T. Partida-Manzanera, Teresa Partida-Manzanera
ORCID: 0000-0002-2834-6340
Observed ORCID: 0000-0002-2834-6340
OpenAlex ID: A5075557284
Failure patterns of solder joints identified through lifetime vibration tests
2022 · Kangkana Baishya, David M. Harvey, et al. · Nondestructive Testing And Evaluation · 21
PDF
Comparative analysis of the effects of tantalum doping and annealing on atomic layer deposited (Ta2O5) x (Al2O3)1− x as potential gate dielectrics for GaN/AlxGa1−xN/GaN high electron mobility transistors
2016 · T. Partida-Manzanera, J. W. Roberts, et al. · Journal of Applied Physics · 13
PDF
Comparison of atomic layer deposited Al2O3 and (Ta2O5)0.12(Al2O3)0.88 gate dielectrics on the characteristics of GaN-capped AlGaN/GaN metal-oxide-semiconductor high electron mobility transistors
2019 · T. Partida-Manzanera, Z. H. Zaidi, et al. · Journal of Applied Physics · 11
PDF
Assessing data-driven predictions of band gap and electrical conductivity for transparent conducting materials
2025 · Federico Ottomano, John Y. Goulermas, et al. · Digital Discovery · 6
PDF
Band Line-up Investigation of Atomic Layer Deposited TiAlO and GaAlO on GaN
2020 · Partha Das, Leanne A. H. Jones, et al. · ECS Journal of Solid State Science and Technology · 6
PDF
Reliability and failure modelling of microelectronic packages based on ultrasonic nondestructive evaluation data
2023 · Haotian Wang, Guang-Ming Zhang, et al. · NDT & E International · 3
PDF
(Invited) Band Line-up of High-k Oxides on GaN
2020 · Ivona Z. Mitrovic, Partha Das, et al. · ECS Transactions · 3
PDF
Correlated Metal LaNiO 3 as a p‐Type Transparent Conductor
2026 · Shivang Beniwal, Emmeline G. Poole, et al. · Advanced Functional Materials
Correlated metal LaNiO3 as a p-type transparent conductor
2026 · Shivang, shivang, Poole, Emmeline, et al. · University of Liverpool
Practical Study to Demonstrate an Increase in the Reliability of Flip Chip Connections by Adding Nanoparticles to Solder
2024 · David M. Harvey, Teresa Partida Manzanera, et al. · IMAPSource Proceedings
PDF
Practical Study to Demonstrate an Increase in the Reliability of Flip Chip Connections by Adding Nanoparticles to Solder
2023 · David M. Harvey, Teresa Partida Manzanera, et al. · European Microelectronics and Packaging Conference
(Invited) Band Line-up of High-k Oxides on GaN
2020 · Ivona Z. Mitrovic, Partha Das, et al. · ECS Meeting Abstracts
Atomic Layer Deposition of Tantalum Doped Aluminium Oxide as a Gate Dielectric for GaN-based Power Transistors
2018 · Partida Manzanera, T · University of Liverpool
Comparative analysis of the effects of tantalum doping and annealing on atomic layer deposited (Ta2O5)x(Al2O3)1x dielectrics for GaN/AlxGa1xN/GaN high electron mobility. transistors applications
2015 · Potter, Richard, Partida, Teresa, et al. · University of Liverpool
Works count: 15
Citation count: 63
H-index: 5
I10-index: 3
Year
Topic
Type