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T. P. Vladimirova

Observed names: T P Vladimirova, T.P. Vladimirova, T. P. Vladimirova, Tetyana P. Vladimirova, Владімірова, Т.П., Т. П. Владимирова
ORCID: 0009-0005-2342-0256
Observed ORCID: 0009-0005-2342-0256
OpenAlex ID: A5075656735
Dynamical theoretical model of the high-resolution double-crystal x-ray diffractometry of imperfect single crystals with microdefects
2008 · V. B. Molodkin, S. I. Olikhovskii, et al. · Physical Review B · 31
Sensitivity of triple‐crystal X‐ray diffractometers to microdefects in silicon
2009 · V. B. Molodkin, S. I. Olikhovskii, et al. · physica status solidi (a) · 18
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X-ray dynamical diffraction by quasi-monolayer graphene
2023 · Olena S. Skakunova, Stepan I. Olikhovskii, et al. · Scientific Reports · 17
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Combined double‐ and triple‐crystal X‐ray diffractometry with account for real defect structures in all crystals of X‐ray optical schemes
2007 · A. P. Shpak, V. B. Molodkin, et al. · physica status solidi (a) · 10
Combined multiparametric X-ray diffraction diagnostics of microdefects in silicon crystals after irradiation by high-energy electrons
2013 · E. N. Kislovskii, V. B. Molodkin, et al. · Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques · 9
Dynamical X‐ray diffraction theory: Characterization of defects and strains in as‐grown and ion‐implanted garnet structures
2017 · S. I. Olikhovskii, V. B. Molodkin, et al. · physica status solidi (b) · 6
Theoretical Three-Axes Model of Dynamical Scattering and Formation of Noncrystalline Objects’ Image
2016 · B. V. Sheludchenko, V. B. Molodkin, et al. · METALLOFIZIKA I NOVEISHIE TEKHNOLOGII · 5
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Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals
2016 · V. B. Molodkin, S. I. Olikhovskii, et al. · METALLOFIZIKA I NOVEISHIE TEKHNOLOGII · 5
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X‐ray diffraction characterization of microdefects in silicon crystals after high‐energy electron irradiation
2011 · V. B. Molodkin, S. I. Olikhovskii, et al. · physica status solidi (a) · 5
Dynamical X‐ray diffractometry of the defect structure of garnet crystals
2011 · V. M. Pylypiv, T. P. Vladimirova, et al. · physica status solidi (a) · 4
Dispersion (Phase) Nature of Structural Sensitivity and Informativity of Triple-Crystal Diffractometry of Defects and Strains within the Ion-Implanted Films
2016 · O. S. Skakunova, S. I. Olikhovskii, et al. · METALLOFIZIKA I NOVEISHIE TEKHNOLOGII · 3
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Quantum-Mechanical Model of Interconsistent Amplitude and Dispersion Influences of Structure Imperfections on the Multiple Scattering Pattern for Mapping and Characterization of Strains and Defects in Ion-Implanted Garnet Films
2016 · V. B. Molodkin, S. I. Olikhovskii, et al. · METALLOFIZIKA I NOVEISHIE TEKHNOLOGII · 3
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Evolution of the microdefect structure in silicon on isothermal annealing as determined by X‐ray diffractometry
2007 · Ye. M. Kyslovskyy, T. P. Vladimirova, et al. · physica status solidi (a) · 3
Method of Deformation Dependencies of Total Integrated Intensity of Dynamical Diffraction by Single Crystals with Defects in the Case of the Dominant Contribution of the Diffuse Component
2019 · V. B. Molodkin, H. I. Nyzkova, et al. · METALLOFIZIKA I NOVEISHIE TEKHNOLOGII · 1
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Anomalous Sensitivity of Deformation Dependence of Total Integrated Intensity of Dynamical Diffraction to Microdefects in Single Crystals
2018 · V. B. Molodkin, A. I. Nizkova, et al. · METALLOFIZIKA I NOVEISHIE TEKHNOLOGII · 1
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Applied Capabilities of X-Ray Topography of Crystals in the Skew-Asymmetric Bragg Diffraction
2018 · I. M. Fodchuk, R. A. Zaplitnyy, et al. · METALLOFIZIKA I NOVEISHIE TEKHNOLOGII · 1
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Modelling and Diagnostics of Damages and Strains in a Crystal of Gd$_{3}$Ga$_{5}$O$_{12}$ After Implantation of F$^{+}$ Ions
2014 · V. O. Kotsyubyns’kyy, V. M. Pylypiv, et al. · Progress in Physics of Metals · 1
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Transformations of microdefect structure in silicon crystals under the influence of weak magnetic field
2011 · T. P. Vladimirova · Semiconductor Physics Quantum Electronics & Optoelectronics · 1
Diagnostics of Nanoscale Defects in Single Crystals by X-Ray Acoustic Method
2025 · V. B. Molodkin, G. I. Nizkova, et al. · Springer proceedings in physics
Parameter determination of ion-implanted layers of single crystals by integrated dynamical diffractometry
2025 · G.I. Nyzkova, B.M. Romanyuk, et al. · Semiconductor Physics Quantum Electronics & Optoelectronics
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X-ray Diagnostics of Nanoscale Defects in Single Crystals by Deformation Dependencies Method for Total Integrated Intensity of Dynamical Diffraction
2024 · V. B. Molodkin, G. I. Nizkova, et al. · Springer proceedings in physics
Method of Deformation Dependences of Total Integrated Intensity of Dynamical Diffraction by Single Crystals with Defects in the Case of the Dominant Contribution of the Diffuse Component. II. The Case of Dynamically ‘Thick’ Crystal
2020 · V. B. Molodkin, H. I. Nyzkova, et al. · METALLOFIZIKA I NOVEISHIE TEKHNOLOGII
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Solving of Direct and Inverse Scattering Problems for Heterogeneous Non-Crystalline Objects in Analyzer-Based Imaging
2019 · G. O. Velikhovskyi, V. B. Molodkin, et al. · METALLOFIZIKA I NOVEISHIE TEKHNOLOGII
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動力学的X線回折理論:成長したままとイオン注入したガーネット構造における欠陥と株の特性化【Powered by NICT】
2017 · S. I. Olikhovskii, V B Molodkin, et al. · physica status solidi (b)
Комбинированная многопараметрическая рентгенодифракционная диагностика микродефектов в кристаллах кремния после облучения высокоэнергетическими электронами
2013 · Е. Н. Кисловский, В. Б. Молодкин, et al. · Поверхность Рентгеновские синхротронные и нейтронные исследования
Works count: 31
Citation count: 124
H-index: 6
I10-index: 4
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