Author

Y. Rosenwaks

Observed names: Rosenwaks, Y., Rosenwaks, Yossi, Y Rosenwaks, Yossi Rosenwaks

Institutions: Afeka College of Engineering, Tel Aviv University

Observed institutions: Afeka College of Engineering, National Laboratory of the Rockies, University of Wisconsin–Madison, Tel Aviv University, Cornell University, Braude College of Engineering Karmiel, Applied Materials (Israel), Soreq Nuclear Research Center, Weizmann Institute of Science

ORCID: 0000-0003-1708-2332

Observed ORCID: 0000-0003-1708-2332

OpenAlex ID: A5076307988

Why Lead Methylammonium Tri-Iodide Perovskite-Based Solar Cells Require a Mesoporous Electron Transporting Scaffold (but Not Necessarily a Hole Conductor)

2014 · Eran Edri, Saar Kirmayer, et al. · Nano Letters · 583

Hot-carrier cooling in GaAs: Quantum wells versus bulk

1993 · Y. Rosenwaks, M. C. Hanna, et al. · Physical review. B, Condensed matter · 261

Kelvin probe force microscopy of semiconductor surface defects

2004 · Y. Rosenwaks, R. Shikler, et al. · Physical Review B · 209

Molecular Control over Semiconductor Surface Electronic Properties: Dicarboxylic Acids on CdTe, CdSe, GaAs, and InP

1999 · R. Cohen, L. Kronik, et al. · Journal of the American Chemical Society · 189

Ferroelectric Domain Breakdown

2003 · Michel Molotskii, Alex Agronin, et al. · Physical Review Letters · 165

Direct Determination of the Hole Density of States in Undoped and Doped Amorphous Organic Films with High Lateral Resolution

2005 · O. Tal, Y. Rosenwaks, et al. · Physical Review Letters · 164

Submicron ferroelectric domain structures tailored by high-voltage scanning probe microscopy

2003 · G. Rosenman, P. Urenski, et al. · Applied Physics Letters · 161

Yellow luminescence and related deep levels in unintentionally doped GaN films

1999 · I. Shalish, L. Kronik, et al. · Physical review. B, Condensed matter · 152

Measurement of Active Dopant Distribution and Diffusion in Individual Silicon Nanowires

2010 · Elad Koren, Noel Berkovitch, et al. · Nano Letters · 140

Fabrication of a Photoelectronic Device by Direct Chemical Binding of the Photosynthetic Reaction Center Protein to Metal Surfaces

2005 · L. Frolov, Y. Rosenwaks, et al. · Advanced Materials · 117

The electronic structure of metal oxide/organo metal halide perovskite junctions in perovskite based solar cells

2015 · Alex Dymshits, Alex Henning, et al. · Scientific Reports · 106

Reconstruction of electrostatic force microscopy images

2005 · E. Strassburg, A. Boag, et al. · Review of Scientific Instruments · 104

Fermi Level Pinning by Gap States in Organic Semiconductors

2013 · S. Yogev, R. Matsubara, et al. · Physical Review Letters · 103

Dynamics of ferroelectric domain growth in the field of atomic force microscope

2006 · A. Agronin, M. Molotskii, et al. · Journal of Applied Physics · 101

Nonuniform doping distribution along silicon nanowires measured by Kelvin probe force microscopy and scanning photocurrent microscopy

2009 · E. Koren, Y. Rosenwaks, et al. · Applied Physics Letters · 94

Kelvin probe force microscopy on III–V semiconductors: the effect of surface defects on the local work function

2003 · Th. Glatzel, S. Sadewasser, et al. · Materials Science and Engineering B · 92

Obtaining Uniform Dopant Distributions in VLS-Grown Si Nanowires

2010 · E. Koren, J. K. Hyun, et al. · Nano Letters · 90

Potential imaging of operating light-emitting devices using Kelvin force microscopy

1999 · R. Shikler, T. Meoded, et al. · Applied Physics Letters · 87

Ferroelectric domain inversion: The role of humidity

2006 · D. Dahan, M. Molotskii, et al. · Applied Physics Letters · 84

The role of the cantilever in Kelvin probe force microscopy measurements

2011 · George Elias, Thilo Glatzel, et al. · Beilstein Journal of Nanotechnology · 83

Reconstruction of surface potential from Kelvin probe force microscopy images

2013 · G Cohen, E Halpern, et al. · Nanotechnology · 77

Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation

2003 · S. Sadewasser, Th. Glatzel, et al. · Applied Surface Science · 76

Controlling electronic properties of CdTe by adsorption of dicarboxylic acid derivatives: Relating molecular parameters to band bending and electron affinity changes

1997 · Rami Cohen, Stéphane Bastide, et al. · Advanced Materials · 76

Picosecond time-resolved luminescence studies of surface and bulk recombination processes in InP

1992 · Y. Rosenwaks, Yoram Shapira, et al. · Physical review. B, Condensed matter · 76

Assessing the performance of two-dimensional dopant profiling techniques

2004 · N. Duhayon, P. Eyben, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 73

Works count: 223

Citation count: 7,118

H-index: 46

I10-index: 141