Author

Z Li

Observed names: Zheng Li, Zhigang Li, Zongqing Li

Institutions: Ludong University, Xiangtan University

Observed institutions: Ludong University, Xiangtan University

ORCID: 0009-0000-9285-3091

Observed ORCID: 0009-0000-9285-3091

OpenAlex ID: A5076950433

Ionizing radiation effect on metal–ferroelectric–insulator–semiconductor memory capacitors

2015 · S A Yan, G Li, et al. · Semiconductor Science and Technology · 7

Correlation Between Geometric Parameters and Capacitance in Silicon Detectors: A Study Based on Physical Modeling, Simulation, and Experiment

2026 · Xinqing Li, Tao Long, et al. · Micromachines

Degradation mechanism of static and capacitance characteristics of 700 V p-GaN gate HEMT under repetitive unclamped inductive switching stress

2026 · Teng Liu, Linna Zhao, et al. · Semiconductor Science and Technology

A fast extraction method of negative bias temperature instability (NBTI) generated permanent defects activation energy using temperature step stress

2026 · Rui Gao, Zixuan Wang, et al. · Semiconductor Science and Technology

Works count: 4

Citation count: 7

H-index: 1

I10-index: