Author

Michael Shandalov

Observed names: M. Shandalov, Shandalov, Michael

Institution: Shimon Peres Negev Nuclear Research Center

Observed institutions: Ben-Gurion University of the Negev, Shimon Peres Negev Nuclear Research Center, Stanford University

ORCID: 0000-0002-1139-0839

Observed ORCID: 0000-0002-1139-0839

OpenAlex ID: A5077806500

Thermal Properties of Ultrathin Hafnium Oxide Gate Dielectric Films

2009 · M.A. Panzer, M. Shandalov, et al. · IEEE Electron Device Letters · 191

Size-dependent polymorphism in HfO2 nanotubes and nanoscale thin films

2009 · Michael Shandalov, Paul C. McIntyre · Journal of Applied Physics · 81

Bilayer metal oxide gate insulators for scaled Ge-channel metal-oxide-semiconductor devices

2010 · Shankar Swaminathan, Michael Shandalov, et al. · Applied Physics Letters · 68

EPITAXY and orientation control in chemical solution deposited PbS and PbSe monocrystalline films

2007 · A. Osherov, M. Shandalov, et al. · Journal of Crystal Growth · 58

Hafnium oxide/germanium oxynitride gate stacks on germanium: Capacitance scaling and interface state density

2009 · Yasuhiro Oshima, Michael Shandalov, et al. · Applied Physics Letters · 52

Microstructure and morphology evolution in chemical solution deposited PbSe films on GaAs(100)

2003 · M. Shandalov, Y. Golan · The European Physical Journal Applied Physics · 47

Chemically deposited PbSe thin films: factors deterring reproducibility in the early stages of growth

2014 · Tzvi Templeman, Moshiel Biton, et al. · CrystEngComm · 37

Microstructure and morphology evolution in chemical solution deposited semiconductor films: 2. PbSe on As face of GaAs(111)

2004 · M. Shandalov, Y. Golan · The European Physical Journal Applied Physics · 34

Microstructure and morphology evolution in chemical solution deposited semiconductor films: 3. PbSe on GaAs vs. Si substrate

2005 · M. Shandalov, Y. Golan · The European Physical Journal Applied Physics · 26

Real Time Monitoring of the Deposition Mechanism in Chemical Solution Deposited PbSe Films Using Light Scattering

2006 · M. Shandalov, Y. Golan · Chemistry of Materials · 25

Coating Platinum Nanoparticles with Methyl Radicals: Effects on Properties and Catalytic Implications

2015 · Ronen Bar‐Ziv, Israel Zilbermann, et al. · Chemistry - A European Journal · 20

Oriented Attachment: A Path to Columnar Morphology in Chemical Bath Deposited PbSe Thin Films

2018 · Tzvi Templeman, Sucheta Sengupta, et al. · Crystal Growth & Design · 19

Enhanced SWIR absorption in chemical bath deposited PbS thin films alloyed with thorium and oxygen

2016 · Tzvi Templeman, Michael Shandalov, et al. · RSC Advances · 18

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Layer-by-layer growth in solution deposition of monocrystalline lead sulfide thin films on GaAs(111)

2019 · Tzvi Templeman, Maayan Perez, et al. · Materials Chemistry Frontiers · 17

Chemical deposition and characterization of thorium-alloyed lead sulfide thin films

2014 · Moshiel Biton, Assaf Shamir, et al. · Thin Solid Films · 16

Optical properties of size quantized PbSe films chemically deposited on GaAs

2007 · M. Shandalov, J. P. Makai, et al. · The European Physical Journal Applied Physics · 15

Citrate-controlled chemical solution deposition of PbSe thin films

2019 · Maayan Perez, Tzvi Templeman, et al. · CrystEngComm · 12

Internal Nano Voids in Yttria-Stabilised Zirconia (YSZ) Powder

2017 · Chen Barad, Gal Shekel, et al. · Materials · 12

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Microstructure related transport phenomena in chemically deposited PbSe films

2008 · M. Shandalov, Z. Dashevsky, et al. · Materials Chemistry and Physics · 12

High temperature electrical conduction in nanoscale hafnia films under varying oxygen partial pressure

2010 · Changhyun Ko, Michael Shandalov, et al. · Applied Physics Letters · 11

Influence of galia (Ga2O3) addition on the phase transformations and crystal growth behavior of zirconia (ZrO2)

2018 · Chen Barad, Giora Kimmel, et al. · Journal of Materials Science · 10

Inelastic electron tunneling study of crystallization effects and defect energies in hafnium oxide gate dielectrics

2011 · Eun Ji Kim, Michael Shandalov, et al. · Applied Physics Letters · 10

Cathodoluminescence study of micro-crack-induced stress relief for AlN films on Si(111)

2006 · G. Sarusi, O. Moshe, et al. · Journal of Electronic Materials · 10

Effect of U and Th trace additions on the precipitation strengthening of Al–0.09Sc (at.%) alloy

2018 · Ofer Beeri, Sung-Il Baik, et al. · Journal of Materials Science · 7

Postgrowth Control of the Interfacial Oxide Thickness in Semiconductor–Insulator–Semiconductor Heterojunctions

2018 · Nitzan Maman, Tzvi Templeman, et al. · Advanced Materials Interfaces · 7

Works count: 41

Citation count: 862

H-index: 15

I10-index: 23