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Wei-Hwa Lin

Observed names: W. J. Lin, Wei-hwa Lin
ORCID: 0009-0009-0053-5965
Observed ORCID: 0009-0009-0053-5965
OpenAlex ID: A5078036391
A New High Density 3D Stackable Via RRAM for Computing-in-Memory SOC Applications
2024 · Siao-Ping Sing, Ya-Ching Wang, et al. · IEEE Transactions on Electron Devices · 8
High Density 7nm FinFET Dielectric RRAM in Embedded Memory Applications
2025 · Pin-Hsuan Shih, Wei-Hwa Lin, et al. · IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) · 2
High Resolution Well-Plasma Detection Device in 16Nm Cmos Finfet Process
2025 · Chieh-Hsin Lin, Wei Chang, et al. · IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) · 1
A New Self-Powered Wireless Sensing Circuitry for On-Wafer In-Situ EUV Detection
2022 · Wei-Hwa Lin, Li Ci Chen, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 1
2T-Pixel Sensors Array for on-Wafer in-Chamber DUV Sensing
2022 · Wei-Hwa Lin, Chien-Ping Wang, et al. · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) · 1
4nm FinFET CMOS Logic Embedded 1T Contact RRAM
2026 · Wei-Hwa Lin, Yen-Yu Liu, et al. · IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
Ultra High Density 1D1R FinFET Dielectric RRAM in 5nm FinFET CMOS Logic Process
2025 · Wei-Hwa Lin, Pin-Hsuan Shih, et al. · Technical digest - International Electron Devices Meeting/Technical digest
Trimmable Via Pin Array Capacitor in Fully Compatible CMOS Logic Process in 16nm FinFET Platform
2025 · Wei-Hwa Lin, Jian-Yu Wang, et al. · International Conference on Solid State Devices and Materials (SSDM)
Characterization and Modeling of 16nm FinFET 3D Stackable Via RRAM
2025 · Wei-Hwa Lin, Tsung-Pei Yang, et al. · International Conference on Solid State Devices and Materials (SSDM)
1T EUV/DUV Detector in Fully Compatible 16nm FinFET Logic Process
2024 · Wei-Hwa Lin, Ting-Kai Huang, et al. · International Conference on Solid State Devices and Materials (SSDM)
CMOS compatible 2T pixel for on-wafer in-situ EUV detection
2023 · Wei-Hwa Lin, Han-Lin Huang, et al. · Discover Nano
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16nm FinFET DUV Detector Array in Fully Compatible FinFET Logic Process
2023 · Wei-Hwa Lin, Jiaw-Ren Shih, et al. · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
FinFET-based P-channel Logic Compatible Differential Floating Gate Memory Cells by Cross-coupled Structure
2021 · Wei-cheng Zhuang, Wei-hwa Lin, et al. · International Conference on Solid State Devices and Materials (SSDM)
Battery-Less Electronic Layer Detectors Array (ELDA) for In-Tool DUV Detection by FinFET CMOS Technology
2021 · Chien-Ping Wang, Wei-Hwa Lin, et al. · IEEE Transactions on Electron Devices
A New Differential Logic-Compatible Multiple-Time Programmable (MTP) Memory Cell
2009 · Y. H. Tsai, H. L. Yang, et al. · International Conference on Solid State Devices and Materials (SSDM)
Works count: 15
Citation count: 13
H-index: 2
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