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Nicole Wils

Observed names: N. A. H. Wils, N. Wils, N.A.H. Wils
Institution: NXP (Netherlands)
ORCID: 0009-0007-3452-7766
Observed ORCID: 0009-0007-3452-7766
OpenAlex ID: A5078202746
Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies
2011 · Paolo Magnone, Felice Crupi, et al. · IEEE Transactions on Electron Devices · 59
Characterization of STI Edge Effects on CMOS Variability
2009 · Nicole Wils, Hans P. Tuinhout, et al. · IEEE Transactions on Semiconductor Manufacturing · 33
Impact of interface states on MOS transistor mismatch
2009 · P. Andricciola, H. P. Tuinhout, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 22
High precision on-wafer backend capacitor mismatch measurements using a benchtop semiconductor characterization system
2009 · Hans Tuinhout, Fleur van Rossem, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 22
Characterization and Modeling of Hot Carrier-Induced Variability in Subthreshold Region
2012 · Paolo Magnone, Felice Crupi, et al. · IEEE Transactions on Electron Devices · 20
Parametric Mismatch Characterization for Mixed-Signal Technologies
2010 · Hans Tuinhout, Nicole Wils, et al. · IEEE Journal of Solid-State Circuits · 16
A Defect-Centric perspective on channel hot carrier variability in nMOSFETs
2015 · L.M. Procel, F. Crupi, et al. · Microelectronic Engineering · 8
Influence of STI stress on drain current matching in advanced CMOS
2008 · Nicole Wils, Hans Tuinhout, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 8
A cross-coupled common centroid test structures layout method for high precision MIM capacitor mismatch measurements
2014 · Hans Tuinhout, Nicole Wils · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 7
Identification and analysis of a new BJT parametric mismatch phenomenon
2005 · N. Wils, H. Tuinhout, et al. · IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) · 6
A 25 mu m/sup 2/ bulk full CMOS SRAM cell technology with fully overlapping contacts
2002 · R.D.J. Verhaar, R.A. Augur, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 6
QUBiC generation 9, a new BiCMOS process optimized for mmWave applications
2015 · Joost Melai, Peter Magnee, et al. · IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) · 5
Low TCL, High-Q Inductors in Standard CMOS
2023 · Thomas J. Hoen, Yanyu Jin, et al. · IEEE Microwave and Wireless Technology Letters · 4
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Methodology to evaluate long channel matching deterioration and effects of transistor segmentation on MOSFET matching
2010 · Hans Tuinhout, Nicole Wils, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 4
Influence of metal coverage on transistor mismatch and variability in copper damascene based CMOS technologies
2010 · Nicole Wils, Hans Tuinhout, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 4
Parametric mismatch characterization for mixed-signal technologies
2009 · Hans Tuinhout, Nicole Wils · IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) · 4
Design and implementation of an ultra high precision parametric mismatch measurement system
2005 · T. Ewert, H. Tuinhoutt, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 4
Scaling low power embedded flash EEPROMs to 0.18um
1999 · Ray Duffy, A. Concannon, et al. · European Solid-State Device Research Conference · 3
Record high-performance RF devices in an advanced FDSOI process enabling integrated Watt-level power amplifiers for WiFi and 5G applications
2019 · T. V. Dinh, B. W. C. Hovens, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 2
Ring-oscillator test-structures for sub-0.1% accuracy wafer-level characterization of active- and standby current consumption, variability, and fast aging of oscillation frequencies
2017 · Maarten Vertregt, Hans Tuinhout, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 2
Design and evaluation of an integrated thin film resistor matching test structure
2015 · Hans Tuinhout, Nicole Wils, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 2
Compact poly-CMP embedded flash memory
2001 · Rob van Schaijk, Nicole Wils, et al. · Microelectronic Engineering · 2
Dimensional characterisation of poly buffer LOCOS in comparison with suppressed LOCOS
1990 · Nicole Wils, P.A. van der Plas, et al. · European Solid-State Device Research Conference · 2
A new sealed poly buffer LOCOS isolation scheme
1991 · N.A.H. Wils, A.H. Montree · Microelectronic Engineering · 1
Towards Ultra Low Thermo-Mechanical Sensitive Capacitors in CMOS
2025 · Thomas J. Hoen, Nicole Wils, et al.
Works count: 30
Citation count: 246
H-index: 8
I10-index: 6
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