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Dong Keun Lee
Observed name:
D. Lee
Institution:
Sogang University
Observed institutions:
Advanced Micro Devices (Canada),
Sogang University
ORCID:
0009-0004-7872-5834
Observed ORCID:
0009-0004-7872-5834
OpenAlex ID:
A5078239419
High performance 32nm SOI CMOS with high-k/metal gate and 0.149µm 2 SRAM and ultra low-k back end with eleven levels of copper
2006
·
B. Greene
, Qingqing Liang
, et al.
·
Symposium on VLSI Technology
·
39
Suppression of Reverse Drain-Induced Barrier Lowering in Negative Capacitance FETs Using a Hetero-Metal-Gate Structure
2025
·
Jae Yeon Park
, Seungwon Go
, et al.
·
IEEE Access
·
2
Mechanical stability analysis of 3D nanosheet-stacked structure
2025
·
Dong Keun Lee
, Taegun Kim
, et al.
·
Engineering Research Express
Demonstration of Ferroelectric Tunnel Field-Effect Transistor for Low Power Synapse Device
2025
·
Seungwon Go
, Sunwoo Lee
, et al.
·
IEEE Transactions on Nanotechnology
Analysis of Bias Temperature Instability in Peripheral CMOS Devices for Low-Temperature Memory Applications
2025
·
Jung Rae Cho
, Seungwon Go
, et al.
·
IEEE Access
Analysis of Transient Response of Negative Capacitance Field-Effect Transistor
2025
·
Dong Keun Lee
, Seungwon Go
, et al.
·
IEEE Access
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Works count:
7
Citation count:
41
H-index:
2
I10-index:
1
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