Author

Paulina Sierak

Observed name: Sierak, Paulina

Institutions: Fraunhofer Center for Applied Research on Supply Chain Services, Fraunhofer Institute for Integrated Circuits

Observed institutions: Fraunhofer Center for Applied Research on Supply Chain Services, Fraunhofer Institute for Integrated Circuits

OpenAlex ID: A5078525210

Position: Embracing Negative Results in Machine Learning

2024 · Karl, Florian, Kemeter, Lukas Malte, et al. · arXiv (Cornell University) · 9

Automated defect recognition in X-ray projections using neural networks trained on simulated and real-world data

2023 · Tobias Schön, Bishwajit Mohan Gosswami, et al. · e-Journal of Nondestructive Testing · 3

Towards Reducing Data Acquisition and Labeling for Defect Detection using Simulated Data

2024 · Kemeter, Lukas Malte, Hvingelby, Rasmus, et al. · arXiv (Cornell University) · 1

Works count: 3

Citation count: 13

H-index: 2

I10-index: