Author

Emanuele Valea

2019 · Emanuele Valea, Mathieu Da Silva, et al. · IEEE Design and Test · 34
2019 · Emanuele Valea, Mathieu Da Silva, et al. · Microelectronics Journal · 26
2018 · Mathieu Da Silva, Emanuele Valea, et al. · 24
2019 · Emanuele Valea, Mathieu Da Silva, et al. · IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) · 18
2021 · Davide Bellizia, Nadia El Mrabet, et al. · IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) · 17
2019 · Emanuele Valea, Mathieu Da Silva, et al. · International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) · 16
2023 · Rafael Carrera Rodriguez, Florent Bruguier, et al. · Conference on Ph.D. Research in Microelectronics and Electronics · 14
2018 · Emanuele Valea, Mathieu Da Silva, et al. · International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) · 11
2021 · Nikolaos Ioannis Deligiannis, Riccardo Cantoro, et al. · IEEE Access · 10
2024 · Juan Suzano, Antoine Chastand, et al. · Proceedings/Proceedings - European Test Workshop · 8
2020 · Riccardo Cantoro, Nikolaos I. Deligiannis, et al. · IEEE Latin American Test Symposium (LATS) · 8
2019 · Marc Merandat, Vincent Reynaud, et al. · 8
2025 · Alessandra Dolmeta, Stefano Di Matteo, et al. · 6
2020 · Quang-Linh Nguyen, Emanuele Valea, et al. · IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) · 5
2025 · Stefano Di Matteo, Ivan Sarno, et al. · IEEE Internet of Things Journal · 4
2024 · Diamante Simone Crescenzo, Rafael Carrera Rodriguez, et al. · IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) · 4
2020 · Riccardo Cantoro, Nikolaos I. Deligiannis, et al. · IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) · 4
2018 · Mathieu Da Silva, Emanuele Valea, et al. · Conference on Ph.D. Research in Microelectronics and Electronics · 4
2025 · Rafael Rodriguez, Florent Bruguier, et al. · IACR Communications in Cryptology · 3
2020 · F. Azais, S. Bernard, et al. · IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) · 3
2019 · Valea, Emanuele, Da Silva, Mathieu, et al. · arXiv (Cornell University) · 3
2017 · R. Cantoro, E. Sanchez, et al. · IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) · 3
2025 · Antonio Ras, Antoine Loiseau, et al. · Euromicro Conference on Digital System Design (DSD) · 2
2021 · Michele Portolan, Emanuele Valea, et al. · IEEE Design and Test · 2
2026 · Antonio Ras, Antoine Loiseau, et al. · IACR Transactions on Cryptographic Hardware and Embedded Systems · 1
Works count: 49
Citation count: 241
H-index: 9
I10-index: 9
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