Author

I. Radley

Observed names: I Radley, Ian Radley, Radley, Ian; Bievenue, Thomas J.; Burdett Jr., John H.; Gallagher, Brian W.; Shakshober, Stuart M.; Chen, Zewu; Moore, Michael D.
OpenAlex ID: A5078805153
2005 · ZW Chen, F Wei, et al. · Journal of ASTM International · 17
2017 · L.H. McAreavey, L.J. Harkness-Brennan, et al. · Journal of Instrumentation · 13
2012 · A. Choubey, P. Veeramani, et al. · Journal of Crystal Growth · 13
2017 · J. T. Mullins, F. Dierre, et al. · Journal of Materials Science Materials in Electronics · 3
2012 · M. Ayoub, F. Dierre, et al. · IEEE Transactions on Nuclear Science · 3
2017 · James W. Hugg, Brian W. Harris, et al. · SPIE Medical Imaging: Physics of Medical Imaging · 1
2013 · M. Ayoub, M. Hage-Ali, et al. · Journal of Applied Physics · 1
2009 · M. Ayoub, F. Dierre, et al. · IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) · 1
2008 · Benjamin J. Cantwell, Fabrice Dierre, et al. · IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) · 1
2023 · Radley, Ian; Bievenue, Thomas J.; Burdett Jr., John H.; Gallagher, Brian W.; Shakshober, Stuart M.; Chen, Zewu; Moore, Michael D. · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
2012 · Andrew K. Rossall, Marios E. Myronakis, et al. · IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
2009 · F. Dierre, S.A. Sakwe, et al. · IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
2009 · P.D. Scott, M. Ayoub, et al. · IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
1998 · Johannes B. Ullrich, Scott Snyder, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Works count: 16
Citation count: 54
H-index: 3
I10-index: 3
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