Author

D. Chikouch

Institution: University Mohamed Boudiaf of M'sila

Observed institution: University Mohamed Boudiaf of M'sila

OpenAlex ID: A5078932283

Normalized differential conductance to study current conduction mechanisms in MOS structures

2018 · T.H. Nouibat, Z. Messai, et al. · Microelectronics Reliability · 2

Works count: 1

Citation count: 2

H-index: 1

I10-index: