Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Luca Bortesi
Observed names:
BORTESI L,
L Bortesi,
L. BORTESI,
L. Bortesi
Observed institutions:
Micron (Italy),
STMicroelectronics (Italy)
OpenAlex ID:
A5079572851
Measurements and extractions of parasitic capacitances in ulsi layouts
2003
·
A. Brambilla
, P. Maffezzoni
, et al.
·
IEEE Transactions on Electron Devices
·
36
3D Simulation study of gate coupling and gate cross-interference in advanced floating gate non-volatile memories
2005
·
Andrea Ghetti
, Luca Bortesi
, et al.
·
Solid-State Electronics
·
25
An Analysis of Temperature Impact on MOSFET Mismatch
2009
·
S. Mennillo
, A. Spessot
, et al.
·
IEEE International Conference on Microelectronic Test Structures (ICMTS)
·
20
Crosstalk-Based Capacitance Measurements: Theory and Applications
2006
·
L. Vendrame
, L. Bortesi
, et al.
·
IEEE Transactions on Semiconductor Manufacturing
·
19
Charge-based on-chip measurement technique for the selective extraction of cross-coupling capacitances
2002
·
Alessandro Bogliolo
, Loris Vendrame
, et al.
·
IEEE Workshop on Signal Propagation on Interconnects (SPI)
·
12
A new test structure for measuring on-chip cross-coupling capacitances
2005
·
A. Bogliolo
, F. Vaira
, et al.
·
Annual Symposium on Foundations of Computer Science
·
4
On-Wafer Analog Pulse Generator for Fast Characterization and Parametric Test of Resistive Switching Memories
2014
·
Erika Covi
, Alessandro Cabrini
, et al.
·
IEEE Transactions on Semiconductor Manufacturing
·
3
On-wafer integrated system for fast characterization and parametric test of new-generation Non Volatile Memories
2013
·
E. Covi
, A. Cabrini
, et al.
·
IEEE International Conference on Microelectronic Test Structures (ICMTS)
·
2
New applications of cross-talk-based capacitance measurements [CMOS ICs]
2005
·
L. Vendrame
, L. Bortesi
, et al.
·
IEEE International Conference on Microelectronic Test Structures (ICMTS)
·
2
New Applications of Cross-Talk-Based Capacitance Measurements
2005
·
L. VENDRAME
, L. BORTESI
, et al.
·
CINECA IRIS Institutional Research information system (University of Urbino)
·
2
Characterization and modeling methodology for the evaluation of statistical variation of MOSFETs
2012
·
L Bortesi
, L. Vendrame
, et al.
·
IEEE International Conference on Microelectronic Test Structures (ICMTS)
Combined test structure for systematic and stochastic mosfets and gate resistance process variation assessment
2010
·
L. Bortesi
, L. Vendrame
, et al.
·
IEEE International Conference on Microelectronic Test Structures (ICMTS)
Metal and Dielectric Thickness: a Comprehensive Methodology for Back-End Electrical Characterization
2009
·
L. Bortesi
, L. Vendrame
·
IEEE International Conference on Microelectronic Test Structures (ICMTS)
Challenging Coupled Problems in TCAD
2006
·
A. Benvenuti
, L. Bortesi
, et al.
·
Mathematics in industry
Time domain approach for the evaluation of RC delays effects in ULSI interconnect lines
2005
·
L. Vendrame
, L. Bortesi
, et al.
·
IEEE Workshop on Signal Propagation on Interconnects (SPI)
Show more works
View as search
Works count:
19
Citation count:
132
H-index:
6
I10-index:
5
Year
Topic
Type
