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Clariza Galendez
Institution:
Intel (United States)
Observed institution:
Intel (United States)
OpenAlex ID:
A5079716888
Reduction of diagnostic fail data volume and tester time using a dynamic N-cover algorithm
2016
·
Shraddha Bodhe
, M. Enamul Amyeen
, et al.
·
Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium
·
14
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Works count:
1
Citation count:
14
H-index:
1
I10-index:
1
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