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P. Goudeau

Observed names: GOUDEAU, Philippe, Goudeau Philippe, Goudeau, P., Goudeau, Ph., Goudeau, Philippe, P Goudeau, P. Goudeau A, PH. Goudeau, Ph Goudeau, Ph. GOUDEAU, Ph. Goudeau, Philippe GOUDEAU, Philippe Goudeau
Observed institutions: Université d'Orléans, Centre National de la Recherche Scientifique, École Nationale Supérieure de Mécanique et d'Aérotechnique, Charles University, Commissariat à l'Énergie Atomique et aux Énergies Alternatives, CEA Paris-Saclay - Etablissement de Saclay, Institut Pprime, CEA Grenoble, Université de Poitiers, Institut Laue-Langevin, Groupe de Recherches sur l'Energétique des Milieux Ionisés
ORCID: 0000-0001-8894-0846
Observed ORCID: 0000-0001-8894-0846
OpenAlex ID: A5080051838
Characterisation of Ti1−xSixNy nanocomposite films
2000 · F Vaz, L Rebouta, et al. · Surface and Coatings Technology · 201
Structural, optical and mechanical properties of coloured TiNxOy thin films
2003 · F Vaz, P Cerqueira, et al. · Thin Solid Films · 197
Influence of nitrogen content on the structural, mechanical and electrical properties of TiN thin films
2004 · F. Vaz, J. Ferreira, et al. · Surface and Coatings Technology · 182
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Structural analysis of Ti1−xSixNy nanocomposite films prepared by reactive magnetron sputtering
1999 · F. Vaz, L. Rebouta, et al. · Surface and Coatings Technology · 104
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Improvement of the tribological behaviour of PVD nanostratified TiN/CrN coatings — An explanation
2006 · C. Mendibide, P. Steyer, et al. · Surface and Coatings Technology · 103
Structural, electrical, optical, and mechanical characterizations of decorative ZrOxNy thin films
2005 · P. Carvalho, F. Vaz, et al. · Journal of Applied Physics · 99
Structural transitions in hard Si-based TiN coatings: the effect of bias voltage and temperature
2001 · F Vaz, L Rebouta, et al. · Surface and Coatings Technology · 95
Young modulus and Poisson ratio measurements of TiO2 thin films deposited with Atomic Layer Deposition
2011 · L. Borgese, M. Gelfi, et al. · Surface and Coatings Technology · 94
Preparation of magnetron sputtered TiNxOy thin films
2003 · F. Vaz, P. Cerqueira, et al. · Surface and Coatings Technology · 88
Study of texture effect on elastic properties of Au thin films by X-ray diffraction and in situ tensile testing
2006 · D. Faurie, P.-O. Renault, et al. · Acta Materialia · 84
Atomistic calculation of size effects on elastic coefficients in nanometre-sized tungsten layers and wires
2004 · P Villain, P Beauchamp, et al. · Scripta Materialia · 84
Property change in ZrNxOy thin films: effect of the oxygen fraction and bias voltage
2004 · F. Vaz, P. Carvalho, et al. · Thin Solid Films · 78
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Size effect on intragranular elastic constants in thin tungsten films
2002 · P. Villain, Ph. Goudeau, et al. · Applied Physics Letters · 78
Measuring thin film and multilayer elastic constants by coupling in situ tensile testing with x-ray diffraction
2002 · K. F. Badawi, P. Villain, et al. · Applied Physics Letters · 76
Poisson’s ratio measurement in tungsten thin films combining an x-ray diffractometer with in situ tensile tester
1998 · P.-O. Renault, K. F. Badawi, et al. · Applied Physics Letters · 72
Development of a synchrotron biaxial tensile device for in situ characterization of thin films mechanical response
2010 · G. Geandier, D. Thiaudière, et al. · Review of Scientific Instruments · 66
Mechanical properties of hard AlCrN-based coated substrates
2009 · E. Le Bourhis, P. Goudeau, et al. · Surface and Coatings Technology · 66
New apparatus for grazing X-ray reflectometry in the angle-resolved dispersive mode
1989 · A. Naudon, J. Chihab, et al. · Journal of Applied Crystallography · 64
PVD grown (Ti,Si,Al)N nanocomposite coatings and (Ti,Al)N/(Ti,Si)N multilayers: structural and mechanical properties
2003 · S. Carvalho, E. Ribeiro, et al. · Surface and Coatings Technology · 62
Influence of the nanostructuration of PVD hard TiN-based films on the durability of coated steel
2007 · Ph. Steyer, A. Mege, et al. · Surface and Coatings Technology · 61
Corrosion resistance of ZrNxOy thin films obtained by rf reactive magnetron sputtering
2004 · E. Ariza, L.A. Rocha, et al. · Thin Solid Films · 61
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Measurement of the elastic constants of textured anisotropic thin films from x-ray diffraction data
2003 · P.-O. Renault, E. Le Bourhis, et al. · Applied Physics Letters · 59
Atomic force microscopy of in situ deformed nickel thin films
1999 · C. Coupeau, J.F. Naud, et al. · Thin Solid Films · 59
Characterization of photoluminescent porous Si by small-angle scattering of x rays
1992 · V. Vezin, P. Goudeau, et al. · Applied Physics Letters · 58
Mechanical characterization of reactively magnetron-sputtered TiN films
2003 · F Vaz, P Machado, et al. · Surface and Coatings Technology · 57
Works count: 315
Citation count: 5,343
H-index: 39
I10-index: 130
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