Author

Hiroshi Sekine

Observed name: H. Sekine
Institution: Canon (Japan)
Observed institution: Canon (Japan)
ORCID: 0000-0002-4457-8213
Observed ORCIDs: 0000-0002-4457-8213, 0009-0000-9536-6424
OpenAlex ID: A5080188467
2021 · K. Morimoto, J. Iwata, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 125
2017 · Masahiro Kobayashi, Yusuke Onuki, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 34
2016 · Kazunari Kawabata, Masahiro Kobayashi, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 10
2024 · K. Morimoto, N. Isoda, et al. · IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) · 9
2019 · Masahiro Kobayashi, Hiroshi Sekine, et al. · Japanese Journal of Applied Physics · 9
2025 · Y. Ota, H. Sekine, et al. · IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) · 6
1982 · N. Suzuki, T. Yamada, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 6
2023 · D. Shirahige, K. Fukuda, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 3
1995 · Y. Takemura, K. Suda, et al. · IEEE Transactions on Consumer Electronics · 1
2025 · M. Shinohara, H. Sekine, et al. · Technical digest - International Electron Devices Meeting/Technical digest
2023 · Hiroshi Sekine · The Journal of The Institute of Image Information and Television Engineers
2022 · Junichi Akita, Hiroshi Sekine, et al. · The Journal of The Institute of Image Information and Television Engineers
2020 · Junichi Akita, Yoshinori Iguchi, et al. · The Journal of The Institute of Image Information and Television Engineers
2018 · M. Kobayashi, H. Sekine, et al. · International Conference on Solid State Devices and Materials (SSDM)
2017 · Yusuke Onuki, Masahiro Kobayashi, et al. · 映像情報メディア学会技術報告
Works count: 23
Citation count: 239
H-index: 7
I10-index: 4
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