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Erich J. Hacker
Observed names:
E Hacker,
E. Hacker,
Hacker, E.
Institution:
Jenoptik (Germany)
Observed institutions:
Jenoptik (Germany),
Fraunhofer-Gesellschaft,
Friedrich Schiller University Jena
OpenAlex ID:
A5080469540
Influence of deposition parameters on the optical and structural properties of TiO2 films produced by reactive d.c. plasmatron sputtering
1981
·
S. Schiller
, G. Beister
, et al.
·
Thin Solid Films
·
99
Structure of thin fluoride films deposited on amorphous substrates
1992
·
U. Kaiser
, N. Kaiser
, et al.
·
Thin Solid Films
·
76
Laser conditioning of LaF_3/MgF_2 dielectric coatings at 248 nm
1996
·
E. Eva
, K. Mann
, et al.
·
Applied Optics
·
44
Structure-related bulk losses in ZrO2 optical thin films
1990
·
A. Duparré
, E. Welsch
, et al.
·
Thin Solid Films
·
22
Review of structural influences on the laser damage thresholds of oxide coatings
1996
·
Erich J. Hacker
, Hans Lauth
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
19
Photoacoustic studies of laser damage in oxide thin films
1994
·
M. Reichling
, J. Siegel
, et al.
·
Thin Solid Films
·
17
Structural influences on the laser damage resistance of optical oxide coatings for use at 1064 nm
1990
·
E. Hacker
, H. Lauth
, et al.
·
Thin Solid Films
·
13
Laser conditioning of LaF 3 /MgF 2 dielectric coatings for excimer lasers
1995
·
Norbert Kaiser
, Bernhard Anton
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
9
Measurement of the extinction of sputtered TiO2 films
1982
·
E. Welsch
, G. Lieder
, et al.
·
Thin Solid Films
·
8
Investigation of thin fluoride films for optical applications by surface analytical methods and electron microscopy
1993
·
D. Mademann
, L. Raupach
, et al.
·
Analytical and Bioanalytical Chemistry
·
6
Structure Correlated Infrared Properties of Fluoride Films
1990
·
A. Lehmann
, W. Heerdegen
, et al.
·
physica status solidi (a)
·
6
Structural influences on the laser damage thresholds of oxide coatings
1993
·
Erich J. Hacker
, Hans Lauth
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
5
Rutherford backscattering analysis of glass surfaces and TiOx thin films
1981
·
H. Fischer
, E. Hacker
, et al.
·
Thin Solid Films
·
5
Properties of Thin Optical Ge Films Related to their Technology Dependent Structure
1991
·
G. Schirmer
, A. Duparré
, et al.
·
physica status solidi (a)
·
4
R.f.-sputtered SiO2 films for optical applications
1982
·
E. Hacker
, U. Katenkamp
, et al.
·
Thin Solid Films
·
4
248-nm laser interaction studies on MgF 2 /LaF 3 optical coatings by mass spectroscopy and x-ray photoelectron spectroscopy
1996
·
Axel Bodemann
, Norbert Kaiser
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
2
Improved method for contamination control during fabrication of space equipment
1994
·
Peter Weissbrodt
, L. Raupach
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
2
Investigation of laser-induced damage at 248 nm in oxide thin films with a pulsed photoacoustic mirage technique
1994
·
J. Siegel
, M. Reichling
, et al.
·
Journal de Physique IV (Proceedings)
·
2
Induced resonance absorption (INDAB) in thin films: a current example for versatile and efficient use of optical coatings in semi-optical processes
1993
·
Hubert Pohlack
, Erich J. Hacker
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
2
Light scattering by SiOx and TiOx films
1981
·
A. Biedermann
, E. Hacker
, et al.
·
Thin Solid Films
·
2
Optically addressable liquid crystal spatial light modulators for VIS to NIR light modulation
1998
·
Erich J. Hacker
, Hans Lauth
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
1
Variable high-resolution color CCD camera system with online capability for professional photo studio application
1998
·
Stefan Breitfelder
, Frank R. Reichel
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
1
Space stability investigations of optical coatings by earth- and space-based experiments
1994
·
Erich J. Hacker
, Peter Weissbrodt
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
1
Degradation of supersmooth surfaces for UV/EUV/x-ray applications in space
2001
·
Dirk-Roger Schmitt
, Helmut H. Toebben
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Investigations Regarding Structure and Optical Properties of HfO2 Films
1997
·
Zsolt Czigány
, D. Mademann
, et al.
·
Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
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Works count:
36
Citation count:
350
H-index:
8
I10-index:
7
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