Author

Erich J. Hacker

Observed names: E Hacker, E. Hacker, Hacker, E.
Institution: Jenoptik (Germany)
OpenAlex ID: A5080469540
1992 · U. Kaiser, N. Kaiser, et al. · Thin Solid Films · 76
1996 · E. Eva, K. Mann, et al. · Applied Optics · 44
1990 · A. Duparré, E. Welsch, et al. · Thin Solid Films · 22
1996 · Erich J. Hacker, Hans Lauth, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 19
1994 · M. Reichling, J. Siegel, et al. · Thin Solid Films · 17
1995 · Norbert Kaiser, Bernhard Anton, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 9
1982 · E. Welsch, G. Lieder, et al. · Thin Solid Films · 8
1993 · D. Mademann, L. Raupach, et al. · Analytical and Bioanalytical Chemistry · 6
1990 · A. Lehmann, W. Heerdegen, et al. · physica status solidi (a) · 6
1993 · Erich J. Hacker, Hans Lauth, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
1981 · H. Fischer, E. Hacker, et al. · Thin Solid Films · 5
1991 · G. Schirmer, A. Duparré, et al. · physica status solidi (a) · 4
1982 · E. Hacker, U. Katenkamp, et al. · Thin Solid Films · 4
1996 · Axel Bodemann, Norbert Kaiser, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
1994 · Peter Weissbrodt, L. Raupach, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
1994 · J. Siegel, M. Reichling, et al. · Journal de Physique IV (Proceedings) · 2
1993 · Hubert Pohlack, Erich J. Hacker · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
1981 · A. Biedermann, E. Hacker, et al. · Thin Solid Films · 2
1998 · Erich J. Hacker, Hans Lauth, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
1998 · Stefan Breitfelder, Frank R. Reichel, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
1994 · Erich J. Hacker, Peter Weissbrodt, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
2001 · Dirk-Roger Schmitt, Helmut H. Toebben, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
1997 · Zsolt Czigány, D. Mademann, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
Works count: 36
Citation count: 350
H-index: 8
I10-index: 7
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