Author

Anna Kuwana

Observed names: A. Kuwana, Anna KUWANA, KUWANA, Anna, Kuwana, Anna
OpenAlex ID: A5080778719
2020 · Shiyu Wang, Md Zakir Hossain, et al. · Biosensors and Bioelectronics · 124
2018 · Yuto Sasaki, Yujie Zhao, et al. · Proceedings - Asian Test Symposium/Proceedings · 21
2023 · Md. Mahmudul Haque Milu, Md. Asadur Rahman, et al. · Engineering Technology & Applied Science Research · 20
2020 · Haruo Kobayashi, Anna Kuwana, et al. · IEEE International Conference on Solid-State and Integrated Circuit Technology · 18
2019 · Haruo Kobayashi, Nene Kushita, et al. · IEEE International Conference on ASIC (ASICON) · 17
2023 · Sakib Abrar Hossain, Md. Asadur Rahman, et al. · Bioengineering · 16
2020 · Tri Minh Tran, Anna Kuwana, et al. · IIAE International Conference on Industrial Application Engineering (ICIAE) · 15
2020 · Tri Minh Tran, Anna Kuwana, et al. · IIAE International Conference on Industrial Application Engineering (ICIAE) · 15
2021 · Jianglin Wei, Anna Kuwana, et al. · IEEE Transactions on Circuits & Systems II Express Briefs · 14
2023 · M. F. Ahmed, N. Pervin, et al. · IEEE photonics journal · 12
2021 · Shuhei Yamamoto, Yuto Sasaki, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 11
2019 · MinhTri Tran, Yifei Sun, et al. · IEEE International Conference on ASIC (ASICON) · 10
2019 · Manato Hirai, Shuhei Yamamoto, et al. · IEEE International Conference on ASIC (ASICON) · 10
2020 · Jianglin Wei, Anna Kuwana, et al. · IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) · 9
2020 · MinhTri Tran, Anna Kuwana, et al. · IEEE Annual Information Technology, Electronics and Mobile Communication Conference (IEMCON) · 9
2019 · Minh Tri Tran, Nene Kushita, et al. · IEEE International Conference on ASIC (ASICON) · 9
2019 · Yuto Sasaki, Tamotsu Ichikawa, et al. · IEEE International Test Conference in Asia (ITC-Asia) · 9
2018 · Jun-ichi Matsuda, Anna Kuwana, et al. · IEEE International Conference on Solid-State and Integrated Circuit Technology · 9
2022 · Shuhei Yamamoto, Yuto Sasaki, et al. · IEEE Transactions on Device and Materials Reliability · 8
2021 · Keno Sato, Takashi Ishida, et al. · IEEE International Test Conference (ITC) · 8
Works count: 157
Citation count: 789
H-index: 12
I10-index: 18
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