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Frank Zachariasse
Observed name:
F. Zachariasse
Observed institutions:
NXP (Netherlands),
Philips (Netherlands),
NXP (Germany)
OpenAlex ID:
A5080788279
Planar Analysis of Copper-Aluminium Intermetallics
2013
·
G.M. O’Halloran
, Arjan van Ijzerloo
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
·
20
Diffractive lenses for high resolution laser based failure analysis
2006
·
Frank Zachariasse
, Martijn Goossens
·
IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
·
14
Diffractive Lenses for High Resolution Laser Based Failure Analysis
2005
·
Frank Zachariasse
, Martijn J. Goossens
·
Proceedings - International Symposium for Testing and Failure Analysis
·
9
A working method for prototyping solid immersion blazed-phase diffractive optics for near-infrared laser microscopy
2008
·
Edward Coyne
, Frank Zachariasse
·
Journal of Micromechanics and Microengineering
·
7
PDF
Reduction of Acquisition Time for RIL, SDL, and LADA
2007
·
Arjan Mels
, Frank Zachariasse
·
Proceedings - International Symposium for Testing and Failure Analysis
·
4
Laser modulation mapping on an unmodified laser scanning microscope
2010
·
Frank Zachariasse
, Gerben Boon
, et al.
·
Microelectronics Reliability
·
3
Product Debug: Speed Problem Related to Unexpected RC Delay
2010
·
J.G. van Hassel
, F. Zachariasse
·
Proceedings - International Symposium for Testing and Failure Analysis
·
1
Integrated Diffractive Lenses for Ultrathin Silicon
2019
·
Marc van Veenhuizen
, Peter van der Cruijsen
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
The Use of a Fresnel Lens on an Actual Failure
2016
·
Marc van Veenhuizen
, Harry Kerver
, et al.
·
Proceedings - International Symposium for Testing and Failure Analysis
Depositing Controlled, Matched Resistors for Circuit Edit of Analog Circuitry
2015
·
Frank Zachariasse
, Harry Roberts
, et al.
·
EDFA Technical Articles
Photon-Based Techniques II
2014
·
Frank Zachariasse
Session 12: Photon Based Techniques - 2
2013
·
Frank Zachariasse
Session 9: Photon Based Techniques - 1
2013
·
Frank Zachariasse
The Rise and Fall of New Failure Analysis Techniques
2011
·
Frank Zachariasse
·
EDFA Technical Articles
Conditional time resolved photoemission for debugging ICs with intermittent faults
2008
·
Frank Zachariasse
, Jan van Hassel
·
Microelectronics Reliability
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Works count:
15
Citation count:
58
H-index:
4
I10-index:
2
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