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Xuehui Dai

Observed names: X. Dai, Xuerong Dai
ORCID: 0009-0004-8483-7541
Observed ORCID: 0009-0004-8483-7541
OpenAlex ID: A5080869248
Overview on Radiation Damage Effects and Protection Techniques in Microelectronic Devices
2024 · Yanru Ren, Min Zhu, et al. · Science and Technology of Nuclear Installations · 52
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Overview of the Properties and Formation Process of Interface Traps in MOS and Linear Bipolar Devices
2025 · Yanru Ren, Min Zhu, et al. · Micromachines · 5
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An Overview on Formation of Radiation-Induced Interface Traps in Silicon-Based Devices
2025 · Xuehui Dai, Min Zhu, et al. · Micromachines · 4
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Uncertainty evaluation of refrigerator energy efficiency test based on Monte Carlo method
2022 · Y. Zhou, T. Xu, et al. · IET conference proceedings. · 1
Research on regularization optimized ANN model in BJTs total ionizing dose effect analysis
2026 · Yanru Ren, Min Zhu, et al. · Nuclear Engineering and Technology
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Overview of hot-carrier and total ionizing dose degradation mechanisms in MOSFETs
2026 · Minghui Liu, Min Zhu, et al. · Radiation Physics and Chemistry
Sequential Sampling Inspection Study of Electronic Product Parts Based on the Monte Carlo Model
2025 · Xuerong Dai · Highlights in Business Economics and Management
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Works count: 7
Citation count: 62
H-index: 3
I10-index: 1
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