Get started
Author

K. U. Pantsialeyeu

Observed names: Kanstantsin Pantsialeyeu, Pantsialeyeu, Kanstantsin
ORCID: 0000-0001-7113-1815
Observed ORCID: 0000-0001-7113-1815
OpenAlex ID: A5081246860
Design of the Contact Potentials Difference Probes
2016 · K. U. Pantsialeyeu, U. A. Mikitsevich, et al. · Devices and Methods of Measurements · 9
PDF
Surface Electric Potential Measurement with a Static Probe
2023 · R. I. Vorobey, O. K. Gusev, et al. · Devices and Methods of Measurements · 5
PDF
Influence of Rapid Thermal Treatment of Initial Silicon Wafers on the Electrophysical Properties of Silicon Dioxide Obtained by Pyrogenous Oxidation
2019 · Vladimir A. Pilipenko, Vitaly A. Solodukha, et al. · High Temperature Material Processes An International Quarterly of High-Technology Plasma Processes · 5
Digital Contact Potential Difference Probe
2016 · K. U. Pantsialeyeu, A. I. Svistun, et al. · Devices and Methods of Measurements · 5
PDF
Universal Digital Probe Electrometer for Testing Semiconductor Wafers
2023 · A. L. Zharin, U. A. Mikitsevich, et al. · Devices and Methods of Measurements · 3
PDF
Analysis of the Electrophysical and Photoelectric Properties of Nanocomposite Polymers by the Modified Kelvin Probe
2017 · K. U. Pantsialeyeu, A. U. Krautsevich, et al. · Devices and Methods of Measurements · 3
PDF
Digital Contact Potential Probe in Studying the Deformation of Dielectric Materials
2020 · Kanstantsin Pantsialeyeu, Anatoly Zharin, et al. · Informatyka Automatyka Pomiary w Gospodarce i Ochronie Środowiska · 2
PDF
Analysis of Surface Defects of Aluminum and Its Alloys With a Scanning Kelvin Probe
2017 · A. K. Tyavlovsky, A. L. Zharin, et al. · Devices and Methods of Measurements · 2
X-ray Diffraction Method in the Study of a Metal Surface Stress State Under Static and Impact Deformation
2023 · A. P. Kren, M. N. Delendik, et al. · Devices and Methods of Measurements · 1
PDF
Intelligent Sensor for Measurement Systems with Sinusoidal Excitation Response
2023 · U. A. Mikitsevich, A. I. Svistun, et al. · Devices and Methods of Measurements · 1
PDF
Charge-Sensitive Technique for Deformation Processes’ Study
2022 · K. U. Pantsialeyeu, U. A. Mikitsevich, et al. · Devices and Methods of Measurements · 1
PDF
Series of Photovoltaic Converters Based on Semiconductors with Intrinsic Photoconductivity
2021 · R. I. Vorobey, O. K. Gusev, et al. · Devices and Methods of Measurements
PDF
Определение Времени Жизни Неравновесных Носителей Заряда И Концентрации Примеси Железа В Полупроводниковых Структурах С Субмикронными Слоями
2020 · Anatoly Zharin, Kanstantsin Pantsialeyeu, et al. · Современные тенденции развития физики полупроводников: достижения, проблемы и перспективы
Контроль Полупроводниковых Пластин По Работе Выхода Электрона Поверхности
2020 · Kanstantsin Pantsialeyeu, Anatoly Zharin, et al. · Современные тенденции развития физики полупроводников: достижения, проблемы и перспективы
Determining the Lifetime of Minority Charge Carriers and Iron Impurity Concentration in Semiconductor Structures With Submicron Layers
2020 · А. Л. Жарин, K. U. Pantsialeyeu, et al.
Works count: 16
Citation count: 37
H-index: 4
I10-index:
Year
Topic
Type