Author

Tobias Beckmann

Observed names: Beckmann, Tobias, T. Beckmann
Institution: d-fine (Germany)
ORCID: 0000-0002-0998-1760
Observed ORCID: 0000-0002-0998-1760
OpenAlex ID: A5081668551
2011 · T. Beckmann, H. Linnenbank, et al. · Physical Review Letters · 147
2012 · Christoph Sebastian Werner, Tobias Beckmann, et al. · Optics Letters · 43
2019 · Markus Fratz, Tobias Beckmann, et al. · Applied Optics · 39
2009 · Judith R. Schwesyg, Tobias Beckmann, et al. · Optics Express · 30
2015 · Sarah-Katharina Meisenheimer, Josef Urban Fürst, et al. · Optics Express · 22
2012 · B. Sturman, T. Beckmann, et al. · Journal of the Optical Society of America B · 16
2021 · Jonas Stevanovic, Tobias Seyler, et al. · Optical Measurement Systems for Industrial Inspection XI · 10
2017 · Annelie Schiller, Tobias Beckmann, et al. · Applied Optics · 9
2020 · Tobias Seyler, Johannes Engler, et al. · Journal of sensors and sensor systems · 7
2017 · Tobias Seyler, Markus Fratz, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2012 · Ingo Breunig, Tobias Beckmann, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2019 · Annelie Schiller, Tobias Beckmann, et al. · APL Photonics · 6
2017 · M. Fratz, T. Beckmann, et al. · SENSOR International Conference on Sensors and Measurement Technology (SENSOR) · 6
2020 · Tobias Seyler, Johannes Engler, et al. · tm - Technisches Messen · 5
2019 · Annelie Schiller, Tobias Beckmann, et al. · Applied Optics · 5
2021 · Gennadii Laskin, Haosu Huai, et al. · Optical Measurement Systems for Industrial Inspection XI · 4
2019 · Markus Fratz, Tobias Beckmann, et al. · Digital Holography and Three-Dimensional Imaging · 4
2018 · Annelie Schiller, Tobias Beckmann, et al. · International Conference on Speckle Metrology (SPECKLE) · 4
2018 · Rainer Börret, Viktor Grün, et al. · International Conference on Speckle Metrology (SPECKLE) · 4
2017 · Annelie Schiller, Tobias Beckmann, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
2014 · Tobias Beckmann, Markus Fratz, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
2021 · Tobias Seyler, Tobias Beckmann, et al. · Imaging and Applied Optics · 3
Works count: 76
Citation count: 454
H-index: 10
I10-index: 10
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