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Kalyan Koley

Observed name: K. Koley
ORCID: 0000-0001-9666-0019
Observed ORCID: 0000-0001-9666-0019
OpenAlex ID: A5081808158
Subthreshold Analog/RF Performance Enhancement of Underlap DG FETs With High- $k$ Spacer for Low Power Applications
2012 · Kalyan Koley, Arka Dutta, et al. · IEEE Transactions on Electron Devices · 64
Impact of the lateral straggle on the Analog and RF performance of TFET
2014 · Sayani Ghosh, Kalyan Koley, et al. · Microelectronics Reliability · 53
Analysis of High- $\kappa $ Spacer Asymmetric Underlap DG-MOSFET for SOC Application
2015 · Kalyan Koley, Arka Dutta, et al. · IEEE Transactions on Electron Devices · 44
Subthreshold analog/RF performance of underlap DG FETs with asymmetric source/drain extensions
2012 · Kalyan Koley, Binit Syamal, et al. · Microelectronics Reliability · 36
Impact of gate metal work-function engineering for enhancement of subthreshold analog/RF performance of underlap dual material gate DG-FET
2014 · Atanu Kundu, Kalyan Koley, et al. · Microelectronics Reliability · 33
Deep insight into linearity and NQS parameters of tunnel FET with emphasis on lateral straggle
2017 · Sayani Ghosh, Kalyan Koley, et al. · Micro & Nano Letters · 30
Breast Cancer and Prostate Cancer Detection Considering Transconductance Generation Factor (gm /I DS) as a Sensing Metric for III–V Gate-All-Around Tunnel FET Biosensor
2023 · Pankaj Kumar, Kalyan Koley · IEEE Sensors Journal · 24
Study of body and oxide thickness variation on analog and RF performance of underlap DG-MOSFETs
2014 · Sudhansu Kumar Pati, Kalyan Koley, et al. · Microelectronics Reliability · 24
Effect of Source/Drain Lateral Straggle on Distortion and Intrinsic Performance of Asymmetric Underlap DG-MOSFETs
2014 · Kalyan Koley, Arka Dutta, et al. · IEEE Journal of the Electron Devices Society · 23
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Investigation of Single-Event-Transient Effects Induced by Heavy-Ion in All-Silicon DG-TFET
2022 · Ashish Maurya, Kalyan Koley, et al. · IEEE Access · 22
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Analog and RF performance optimization for gate all around tunnel FET using broken-gap material
2022 · Pankaj Kumar, Kalyan Koley, et al. · Scientific Reports · 20
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Impact of temperature on linearity and harmonic distortion characteristics of underlapped FinFET
2016 · Arka Dutta, Kalyan Koley, et al. · Microelectronics Reliability · 18
The Understanding of SiNR and GNR TFETs for Analog and RF Application With Variation of Drain-Doping Molar Fraction
2018 · Bhubon Chandra Mech, Kalyan Koley, et al. · IEEE Transactions on Electron Devices · 17
Analysis of Harmonic Distortion in UDG-MOSFETs
2014 · Arka Dutta, Kalyan Koley, et al. · IEEE Transactions on Electron Devices · 15
Investigation of Source Region’s Random Doping Fluctuation Effects on Analog and RF Performance in All-Si DG-TFET
2022 · Ashish Maurya, Kalyan Koley, et al. · IEEE Transactions on Electron Devices · 14
Assessment of Negative Bias Temperature Instability Due to Interface and Oxide Trapped Charges in Gate-All-Around TFET Devices
2023 · Pankaj Kumar, Kalyan Koley, et al. · IEEE Transactions on Nanotechnology · 12
Physical Insights Into Electric Field Modulation in Dual- $k$ Spacer Asymmetric Underlap FinFET
2016 · Arka Dutta, Kalyan Koley, et al. · IEEE Transactions on Electron Devices · 12
Comparative analysis of heavy ions and alpha particles impact on gate-all-around TFETs and gate-all-around MOSFETs
2024 · Pankaj Kumar, Kalyan Koley, et al. · Micro and Nanostructures · 11
High-Performance Asymmetric Underlap Ge-pTFET With Pocket Implantation
2016 · Sayani Ghosh, Kalyan Koley, et al. · IEEE Transactions on Electron Devices · 11
Analysis of Harmonic distortion in asymmetric underlap DG-MOSFET with high-k spacer
2013 · Arka Dutta, Kalyan Koley, et al. · Microelectronics Reliability · 11
RF parameter extraction of Bulk FinFET: A non quasi static approach
2010 · Atanu Kundu, Binit Syamal, et al. · IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) · 11
An Analytical BTBT Current Model of Symmetric/Asymmetric 4T Tunnel Double Gate FETs With Ambipolar Characteristic
2016 · Pradipta Dutta, Kalyan Koley, et al. · IEEE Transactions on Electron Devices · 10
Influence of the Gate Height Engineering on the Intrinsic Parameters of UDG-MOSFETs With Nonquasi Static Effect
2015 · Sayani Ghosh, Kalyan Koley, et al. · IEEE Journal of the Electron Devices Society · 10
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Impact of underlap and mole-fraction on RF performance of strained-Si/Si 1− x Ge x /strained-Si DG MOSFETs
2014 · Arka Dutta, Kalyan Koley, et al. · Superlattices and Microstructures · 9
Design, simulation and analog/RF performance evaluation of a hetero-stacked source dual metal T-shaped gate tunnel-FET in thermally variable environments
2024 · Mukesh Kumar, Gautam Bhaskar, et al. · Microsystem Technologies · 7
Works count: 58
Citation count: 612
H-index: 14
I10-index: 23
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