Author

Richard S. Hutton

Observed names: R. Hutton, R. S. HUTTON, R. S. Hutton, R.S. Hutton, Richard Hutton
OpenAlex ID: A5082377496
1970 · Edel Wasserman, V. J. Kuck, et al. · Journal of the American Chemical Society · 94
1991 · Howard E. Katz, M. L. Schilling, et al. · Chemistry of Materials · 74
1974 · E. Wasserman, R. S. Hutton, et al. · Journal of the American Chemical Society · 59
1974 · R. S. Hutton, M. L. Manion, et al. · Journal of the American Chemical Society · 48
1971 · E. Wasserman, V. J. Kuck, et al. · The Journal of Chemical Physics · 39
1977 · J. J. Hauser, F. J. Disalvo, et al. · Philosophical magazine · 36
1971 · E. Wasserman, V. J. Kuck, et al. · Journal of the American Chemical Society · 31
1971 · E. Wasserman, R. S. Hutton, et al. · The Journal of Chemical Physics · 30
1982 · Richard S. Hutton, Heinz D. Roth · Journal of the American Chemical Society · 28
1978 · Richard S. Hutton, Heinz D. Roth · Journal of the American Chemical Society · 28
1985 · Heinz D. Roth, Richard S. Hutton · Tetrahedron · 26
1976 · J. J. Hauser, R. S. Hutton · Physical Review Letters · 26
1979 · Richard S. Hutton, Heinz D. Roth, et al. · Journal of the American Chemical Society · 23
1976 · F.J. Di Salvo, B.G. Bagley, et al. · Solid State Communications · 23
1985 · T. T. Wang, S. Tasaka, et al. · Journal of the Chemical Society Chemical Communications · 22
1979 · E. A. Truesdale, R. S. Hutton · Journal of the American Chemical Society · 21
1997 · Francis M. Houlihan, Thomas I. Wallow, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 20
1983 · Heinz D. Roth, Marcia L. Manion Schilling, et al. · Journal of the American Chemical Society · 20
1998 · O. Nalamasu, F. M. Houlihan, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 19
1997 · F.M. Houlihan, T. Wallow, et al. · Journal of Photopolymer Science and Technology · 17
1995 · Richard S. Hutton, Craig H. Boyce, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 17
1983 · Richard S. Hutton, Heinz D. Roth, et al. · Journal of the American Chemical Society · 17
Works count: 95
Citation count: 1,191
H-index: 20
I10-index: 38
Year
Topic
Type