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Author

Marcello Traiola

Observed names: M. Traiola, Traiola, Marcello
Institutions: Centre National de la Recherche Scientifique, Institut national de recherche en sciences et technologies du numérique, Institut de Recherche en Informatique et Systèmes Aléatoires, Centre Inria de l'Université de Rennes, TARAN: Architectures matérielles spécialisées pour l'ère post loi-de-Moore, Université de Rennes
Observed institutions: Lyon 1 Université, École Centrale de Lyon, Centre National de la Recherche Scientifique, Institut national de recherche en sciences et technologies du numérique, Université de Montpellier, Institut des Nanotechnologies de Lyon, COMUE Languedoc-Roussillon Universités, Institut de Recherche en Informatique et Systèmes Aléatoires, Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, Centre Inria de l'Université de Rennes, TARAN: Architectures matérielles spécialisées pour l'ère post loi-de-Moore, Institut National des Sciences Appliquées de Lyon, Université de Rennes, École d'Ingénieurs en Chimie et Sciences du Numérique, University of Naples Federico II
ORCID: 0000-0003-1484-5162
Observed ORCID: 0000-0003-1484-5162
OpenAlex ID: A5082995771
A Survey on Deep Learning Resilience Assessment Methodologies
2023 · Annachiara Ruospo, Ernesto Sanchez, et al. · Computer · 56
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Investigating data representation for efficient and reliable Convolutional Neural Networks
2021 · Annachiara Ruospo, Ernesto Sanchez, et al. · Microprocessors and Microsystems · 56
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Multi-Objective Application-Driven Approximate Design Method
2021 · Salvatore Barone, Marcello Traiola, et al. · IEEE Access · 42
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Selective Hardening of Critical Neurons in Deep Neural Networks
2022 · Annachiara Ruospo, Gabriele Gavarini, et al. · 31
A Survey of Testing Techniques for Approximate Integrated Circuits
2020 · Marcello Traiola, Arnaud Virazel, et al. · Proceedings of the IEEE · 29
Test and Reliability in Approximate Computing
2018 · Lorena Anghel, Mounir Benabdenbi, et al. · Journal of Electronic Testing · 28
A Genetic-algorithm-based Approach to the Design of DCT Hardware Accelerators
2022 · Mario Barbareschi, Salvatore Barone, et al. · ACM Journal on Emerging Technologies in Computing Systems · 25
A Test Pattern Generation Technique for Approximate Circuits Based on an ILP-Formulated Pattern Selection Procedure
2019 · Marcello Traiola, Arnaud Virazel, et al. · IEEE Transactions on Nanotechnology · 22
Testing approximate digital circuits: Challenges and opportunities
2018 · Marcello Traiola, Arnaud Virazel, et al. · IEEE Latin American Test Symposium (LATS) · 21
QAMR: an Approximation-Based Fully Reliable TMR Alternative for Area Overhead Reduction
2020 · B. Deveautour, M. Traiola, et al. · Proceedings/Proceedings - European Test Workshop · 20
Design, Verification, Test and In-Field Implications of Approximate Computing Systems
2020 · A. Bosio, S. Di Carlo, et al. · Proceedings/Proceedings - European Test Workshop · 19
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Reliability and Security of AI Hardware
2024 · Dennis Gnad, Martin Gotthard, et al. · Proceedings/Proceedings - European Test Workshop · 18
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Towards approximation during test of Integrated Circuits
2017 · Imran Wali, Marcello Traiola, et al. · IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) · 18
Towards Dependable RISC-V Cores for Edge Computing Devices
2023 · Pegdwende Romaric Nikiema, Alessandro Palumbo, et al. · IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) · 17
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Design Space Exploration of Approximation-Based Quadruple Modular Redundancy Circuits
2021 · Marcello Traiola, Jorge Echavarria, et al. · 17
Probabilistic estimation of the application-level impact of precision scaling in approximate computing applications
2019 · Marcello Traiola, Alessandro Savino, et al. · Microelectronics Reliability · 17
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Predicting the Impact of Functional Approximation: from Component- to Application-Level
2018 · Marcello Traiola, Alessandro Savino, et al. · IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) · 17
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harDNNing: a machine-learning-based framework for fault tolerance assessment and protection of DNNs
2023 · Marcello Traiola, Angeliki Kritikakou, et al. · Proceedings/Proceedings - European Test Workshop · 16
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Cross-Layer Reliability Evaluation and Efficient Hardening of Large Vision Transformers Models
2024 · Lucas Roquet, Fernando Fernandes dos Santos, et al. · Proceedings - ACM IEEE Design Automation Conference · 15
Impact of High-Level Synthesis on Reliability of Artificial Neural Network Hardware Accelerators
2024 · Marcello Traiola, Fernando Fernandes dos Santos, et al. · IEEE Transactions on Nuclear Science · 15
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Emerging Computing Devices: Challenges and Opportunities for Test and Reliability
2021 · Alberto Bosio, Ian O'Connor, et al. · Proceedings/Proceedings - European Test Workshop · 15
Maximizing Yield for Approximate Integrated Circuits
2020 · Marcello Traiola, Arnaud Virazel, et al. · Design, Automation, and Test in Europe · 15
On the Comparison of Different ATPG Approaches for Approximate Integrated Circuits
2018 · Marcello Traiola, Arnaud Virazel, et al. · IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) · 15
XbarGen: A memristor based boolean logic synthesis tool
2016 · Marcello Traiola, Mario Barbareschi, et al. · IFIP/IEEE International Conference on Very Large Scale Integration · 15
Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks
2021 · Annachiara Ruospo, Lucas Matana Luza, et al. · IEEE Latin American Test Symposium (LATS) · 11
Works count: 83
Citation count: 730
H-index: 17
I10-index: 30
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