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Suman Gora

Observed name: Gora, Suman
ORCID: 0009-0000-4336-5390
Observed ORCID: 0009-0000-4336-5390
OpenAlex ID: A5083230462
Asymmetric resistive switching by anion out-diffusion mechanism in transparent Al/ZnO/ITO heterostructure for memristor applications
2022 · Suman Gora, Lavanya Thyda, et al. · Surfaces and Interfaces · 20
Probing the Photo-Activated Switching Dynamics of Halide Perovskite Memristors
2023 · Deepak Yadav, Suman Gora, et al. · ACS Applied Electronic Materials · 15
Germanium Doped SnO₂: An Exploratory Channel Material for High On–Off Current Ratio and Low Subthreshold Slope in n-Type SnO₂:Ge Thin Film Transistor
2024 · Jay Singh, Suman Gora, et al. · IEEE Transactions on Electron Devices · 7
Impact of Edge and Basal Plane Oxidation on the Stability of Oxygen Doped MoS2- RRAM
2024 · Suman Gora, Jay Singh, et al. · IEEE International Reliability Physics Symposium proceedings · 3
Bio-Inspired Learning in N 2 -Doped SnO 2 -Based Photonic Memristor Synapse
2025 · Suman Gora, Jay Singh, et al. · IEEE Electron Device Letters · 2
Boosting hole mobility in p-type SnOx (x < 2) film through Ge incorporation via co-sputtering
2025 · Jay Singh, Suman Gora, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1
Thermionic Emission-Diffusion and Series-Shunt Path Limited Electron Transport in Total Ionizing Dose Exposed IGZO/Pt Schottky Barrier Diode
2026 · Jay Singh, Suman Gora, et al. · International Conference on Solid State Devices and Materials (SSDM)
Combined Impedance Spectroscopy and Physical Characterization Unveils Kinetics of Ag Cations in the SET State of Ag/ZrO x :Al/Pt-RRAM With Variable Oxygen Vacancies
2026 · Suman Gora, Mandeep Jangra, et al. · IEEE Transactions on Materials for Electron Devices
Optically Pumped Visible Light Emission from Si/MgO Broken Gap Heterojunction
2026 · Mandeep Jangra, Suman Gora, et al.
Isoelectronic Doping in Tin Oxide by Ge Leading to Mobility Increase of Hole and Electron: Experiments and DFT Simulation
2025 · Jay Singh, Suman Gora, et al. · International Conference on Simulation of Semiconductor Processes and Devices
Enhancing Bias Stress Stability and VTH Recovery of n-Type SnO2:Ge Thin Film Transistor
2025 · Jay Singh, Suman Gora, et al. · IEEE International Reliability Physics Symposium proceedings
Reliability of InGaZnO Transparent ReRAM with Optically Active Pt-Nanodisks
2023 · Kavita Vishwakarma, Rishabh Kishore, et al. · IEEE International Reliability Physics Symposium proceedings
Works count: 14
Citation count: 48
H-index: 3
I10-index: 2
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