Author

G. Eckstein

Observed name: Gerald Eckstein
Institution: Siemens (Germany)
Observed institution: Siemens (Germany)
OpenAlex ID: A5083546943
2003 · B. Eversmann, M. Jenkner, et al. · IEEE Journal of Solid-State Circuits · 375
2003 · B. Eversmann, M. Jenkner, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 212
2007 · Ingo Kuehne, Alexander Frey, et al. · Sensors and Actuators A Physical · 64
2004 · R. Gabl, E. Green, et al. · Proceedings of IEEE Sensors/Proceedings of IEEE Sensors ... · 64
2002 · R. Thewes, F. Hofmann, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 59
2007 · Ingo Kuehne, Djordje Marinkovic, et al. · Sensors and Actuators A Physical · 39
2003 · F. Hofmann, A. Frey, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 33
2006 · D. Sickert, S. Taeger, et al. · physica status solidi (b) · 19
2006 · Sebastian Taeger, Daniel Sickert, et al. · physica status solidi (b) · 18
2004 · F. Hofmann, B. Eversmann, et al. · IEEE Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) · 12
2006 · Ingo Kuehne, Alexander Frey, et al. · European Solid-State Device Research Conference · 7
2007 · Ingo Kühne, Gerald Eckstein, et al. · tm - Technisches Messen
Works count: 14
Citation count: 1,068
H-index: 11
I10-index: 11
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