Get started
Author

Hans Manhaeve

On-chip transient current monitor for testing of low-voltage CMOS IC
1999 · V. Stopjaková, H. Manhaeve, et al. · Design, Automation, and Test in Europe · 35
An off-chip IDDq current measurement unit for telecommunication ASICs
2002 · H.A.R. Manhaeve, P.L. Wrighton, et al. · IEEE International Test Conference (ITC) · 30
Dependable Multicore Architectures at Nanoscale: The View From Europe
2014 · Marco Ottavi, Salvatore Pontarelli, et al. · IEEE Design and Test · 27
PDF
Off chip monitors and built in current sensors for analogue and mixed signal testing
2002 · Y. Maidon, Y. Deval, et al. · 13
A practical evaluation of I/sub DDQ/ test strategies for deep submicron production test application. Experiences and targets from the field
2004 · A. Fudoli, A. Ascagni, et al. · IEEE European Test Symposium (ETS) · 10
Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology
2000 · H. Manhaeve, J. Verfaillie, et al. · Journal of Electronic Testing · 9
Current testing for nanotechnologies: a demystifying application perspective
2005 · H. Manhaeve · IEEE International Workshop on Current and Defect Based Testing (DBT) · 8
On-chip transient current monitor for testing of low-voltage CMOS IC
2003 · V. Stopjakova, H. Manhaeve, et al. · Design, Automation, and Test in Europe · 8
Implementation of a BIC monitor in a new analog BIST structure
2002 · M. Sidiropulos, V. Stopjakova, et al. · IEEE International Workshop on IDDQ Testing (IDDQ) · 8
CCII+ current conveyor based BIC monitor for I/sub DDQ/ testing of complex CMOS circuits
2002 · V. Stopjakova, H. Manhaeve · European Design and Test Conference · 8
Application of supply current testing to analogue circuits, towards a structural analogue test methodology
2003 · H. Manhaeve, J. Verfaillie, et al. · IEEE European Test Symposium (ETS) · 7
A real world application used to implement a true IDDQ based test strategy (facts and figures)
2003 · H. Manhaeve, J.S. Vaccaro, et al. · IEEE European Test Symposium (ETS) · 6
Implementation of BIC monitor in balanced analogueself-test
1996 · M. Sidiropulos, V. Stopjakova, et al. · Electronics Letters · 6
Current Testing for Nanotechnologies: A Demystifying Application Perspective.
2005 · H. Manhaeve · Proceedings - Asian Test Symposium/Proceedings · 5
Semi-digital off-chip I/sub DDQ/ monitor developments: towards a general-purpose digital current monitor
2002 · H. Manhaeve, M. Svajda, et al. · IEEE International Workshop on IDDQ Testing (IDDQ) · 5
Delta-IDDQ Testing of Resistive Short Defects
2006 · Piet Engelke, Ilia Polian, et al. · 4
Delta-IDDQ Testing of Resistive Short Defects
2006 · Piet Engelke, Ilia Polian, et al. · Proceedings - Asian Test Symposium/Proceedings · 4
Alternative Multivariate Methods for State Estimation, Anomaly Detection, and Prognostics
2018 · Ferenc Szidarovszky, Doug Goodman, et al. · IEEE AUTOTESTCON (IEEE Systems Readiness Technology Conference) · 3
An Analog Self-Test Based on Differential I DD Monitoring Supported by Differential I OUT Checking
1999 · M. Sidiropulos, V. Stopjaková, et al. · Analog Integrated Circuits and Signal Processing · 3
Application-Specific Solutions
2017 · Viacheslav Izosimov, Antonis Paschalis, et al. · Springer eBooks · 2
Semiconductor failure modes and mitigation for critical systems embedded tutorial
2013 · Hans Manhaeve, Esko Mikkola · IEEE European Test Symposium (ETS) · 2
Theoretical and Practical Aspects of IDDQ Settling-Impact on Measurement Timing and Quality
2008 · B. Straka, H. Manhaeve, et al. · Design, Automation, and Test in Europe · 2
An on-chip detection circuit for the verification of IC supply connections
2002 · H. Manhaeve, S. Kerckenaere · Proceedings · 2
On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs
2020 · Ghazanfar Ali, Leila Bagheriye, et al. · Proceedings - Asian Test Symposium/Proceedings · 1
Theoretical and practical aspects of Iddq Settling
2008 · B. Straka, H. Manhaeve, et al. · Design, Automation, and Test in Europe · 1
Works count: 39
Citation count: 214
H-index: 8
I10-index: 5
Year
Topic
Type