Author

J.H. Lee

Observed names: J.H. Lee,, Jae-Heon Lee
ORCID: 0009-0001-9021-4605
Observed ORCID: 0009-0001-9021-4605
OpenAlex ID: A5083968530
2003 · G.S. Kim, S.Y. Lee, et al. · Surface and Coatings Technology · 117
2008 · S.H. Kang, Y.S. Lee, et al. · Journal of Materials Processing Technology · 103
2008 · Y.S. Lee, Y.N. Kwon, et al. · Journal of Materials Processing Technology · 76
2008 · J.H. Lee, W.J. Yang, et al. · Engineering Failure Analysis · 15
2026 · Ji Won Heo, Gwang-Seok Chae, et al. · ACS Nano · 4
2008 · Y.S. Na, J.H. Lee, et al. · Engineering Failure Analysis · 3
2008 · W.D. Yoo, J.H. Lee, et al. · Engineering Failure Analysis · 1
2024 · Jae-Heon Lee, Hee-Jung Yeom, et al. · Journal of Applied Physics
2014 · J.E. Kim, J.H. Lee, et al. · Journal of the Korean Society for Heat Treatment
2002 · S.Y. Lee,, J.H. Yang,, et al. · High Temperature Materials and Processes
Works count: 14
Citation count: 354
H-index: 5
I10-index: 5
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