Author

Elad Ilan

Observed name: E. Ilan
OpenAlex ID: A5084423730
2017 · P. C. Klipstein, E. Avnon, et al. · Journal of Electronic Materials · 28
2017 · R. Fraenkel, E. Berkowicz, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 20
2015 · P. C. Klipstein, E. Avnon, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 20
2009 · O. Nesher, I. Pivnik, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 18
2013 · Lior Shkedy, Rami Fraenkel, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 16
2013 · G. Gershon, A. Albo, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 16
2016 · R. Fraenkel, E. Berkowicz, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 15
2011 · Lidia Langof, Dan Nussinson, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 14
2012 · Rami Fraenkel, Daniel Aronov, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 13
2017 · P.C. Klipstein, E. Avnon, et al. · Defence Science Journal · 8
2005 · U. Mizrahi, A. Fraenkel, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
2013 · Elad Ilan, Niv Shiloah, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
2014 · Lior Shkedy, A. I. Koifman, et al. · 4
2011 · T. Markovitz, I. Pivnik, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
Works count: 15
Citation count: 189
H-index: 9
I10-index: 9
Year
Topic
Type