Author

Hamed Alemansour

Observed names: Alemansour, Hamed, H Alemansour, H. Alemansour, Hamed Alemansoor

Institution: Quantum Design (United States)

Observed institutions: Sharif University of Technology, The University of Texas at Dallas, Zyvex (United States), Quantum Design (United States)

ORCID: 0000-0002-8884-9281

Observed ORCID: 0000-0002-8884-9281

OpenAlex ID: A5084758374

An adjustable-stiffness MEMS force sensor: Design, characterization, and control

2018 · Mohammad Maroufi, Hamed Alemansour, et al. · Mechatronics · 50

Effect of size on the chaotic behavior of nano resonators

2016 · Hamed Alemansour, Ehsan Maani Miandoab, et al. · Communications in Nonlinear Science and Numerical Simulation · 37

$Q$ Control of an Active AFM Cantilever With Differential Sensing Configuration

2018 · M. Bulut Coskun, Hamed Alemansour, et al. · IEEE Transactions on Control Systems Technology · 31

A High Dynamic Range Closed-Loop Stiffness-Adjustable MEMS Force Sensor

2020 · Mohammad Maroufi, Hamed Alemansour, et al. · Journal of Microelectromechanical Systems · 25

A Highly Integrated AFM-SEM Correlative Analysis Platform

2023 · A Alipour, K T Arat, et al. · Microscopy Today · 19

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Controlled removal of hydrogen atoms from H-terminated silicon surfaces

2020 · Hamed Alemansour, S. O. Reza Moheimani, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 10

Ultrafast method for scanning tunneling spectroscopy

2021 · Hamed Alemansour, S. O. Reza Moheimani, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 9

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High signal-to-noise ratio differential conductance spectroscopy

2021 · Hamed Alemansour, S. O. Reza Moheimani, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 8

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A Closed-loop MEMS force sensor with adjustable stiffness

2017 · Mohammad Maroufi, Hamed Alemansour, et al. · IEEE Conference on Control Technology and Applications (CCTA) · 8

A New Correlative Microscopy Platform Integrating AFM with in situ SEM

2023 · Kerim Arat, Hamed Alemansour, et al. · Microscopy and Microanalysis · 5

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A new approach to removing H atoms in hydrogen depassivation lithography

2020 · S. O. Reza Moheimani, Hamed Alemansoor · SPIE Novel Patterning Technologies · 4

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A Feedback Controlled MEMS Probe Scanner for On-chip AFM

2019 · Hamed Alemansour, Mohammad Maroufi, et al. · IFAC-PapersOnLine · 2

Model-Based Control of the Scanning Tunneling Microscope: Enabling New Modes of Imaging, Spectroscopy, and Lithography