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T.C. Lu
Observed names:
T. C. Lu,
Tao-Chen Lu,
Tao-Cheng Lu
Institution:
Macronix International (Taiwan)
Observed institution:
Macronix International (Taiwan)
OpenAlex ID:
A5084851750
Analysis and Realization of TLC or even QLC Operation with a High Performance Multi-times Verify Scheme in 3D NAND Flash memory
2018
·
C.C. Lu
, C. C. Cheng
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
10
A new methodology for assessment of the susceptibility to data retention in floating gate non-volatile memories
2017
·
Chih-Ching Shih
, Ming-Yi Lee
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
2
A Page-Buffer and Fail-Bit Counter-Based In-Memory Computing Platform for 3-D NAND Flash Memory
2026
·
Wen-Jer Tsai
, Chun-Chang Lu
, et al.
·
IEEE Journal on Emerging and Selected Topics in Circuits and Systems
·
1
A Robust Read-Based PUF Generation Method in a 3-D NAND Flash Memory
2026
·
You-Liang Chou
, Wen-Jer Tsai
, et al.
·
IEEE Transactions on Electron Devices
·
1
RTN modulation by neighboring word-line Vt level in 1Xnm floating gate NAND strings
2018
·
C.C. Cheng
, Y.H. Chen
, et al.
·
International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
·
1
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Works count:
5
Citation count:
15
H-index:
2
I10-index:
1
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