Author

Maximilian Szabo

Observed name: Szabo, Maximilian

Institution: Fraunhofer Institute for Integrated Systems and Device Technology

Observed institutions: Friedrich-Alexander-Universität Erlangen-Nürnberg, Fraunhofer Institute for Integrated Systems and Device Technology

ORCID: 0000-0003-3413-6224

Observed ORCID: 0000-0003-3413-6224

OpenAlex ID: A5084871037

Unconventional conductivity increase in multilayer black phosphorus

2023 · Maria Koleśnik-Gray, Laura Meingast, et al. · npj 2D Materials and Applications · 24

Correlating Optical Microspectroscopy with 4×4 Transfer Matrix Modeling for Characterizing Birefringent Van der Waals Materials

2023 · Julian Schwarz, Michael Niebauer, et al. · Small Methods · 14

Fast Estimation of the Lateral Fidelity of Ion Implantation in 4H-SiC through Calibration to JFET Transfer Characteristics in TCAD

2024 · Kota Sakai, Norman Boettcher, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 1

Extraction of Trench Sidewall Capacitance by Linear Component Separation towards Wafer Level Evaluation

2026 · Maximilian Szabo, Tom Becker, et al. · Materials science forum

Extraction of Trench Sidewall Capacitance by Linear Component Separation towards Wafer Level Evaluation

2026 · Szabo, Maximilian, Becker, Tom, et al. · Fraunhofer-Publica (Fraunhofer-Gesellschaft)

Correlating Optical Microspectroscopy with 4×4 Transfer Matrix Modeling for Characterizing Birefringent Van der Waals Materials (Small Methods 10/2023)

2023 · Julian Schwarz, Michael Niebauer, et al. · Small Methods

Works count: 6

Citation count: 39

H-index: 2

I10-index: 2