Author

Natalia Lylina

Observed names: Lylina, Natalia, N. Lylina
Observed institution: University of Stuttgart
ORCID: 0000-0003-2358-0266
Observed ORCID: 0000-0003-2358-0266
OpenAlex ID: A5084998579
2019 · Pascal Raiola, Benjamin Thiemann, et al. · Design, Automation, and Test in Europe · 15
2019 · Natalia Lylina, Ahmed Atteya, et al. · IEEE International Test Conference (ITC) · 7
2021 · Chih-Hao Wang, Natalia Lylina, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 6
2020 · Natalia Lylina, Ahmed Atteya, et al. · IEEE International Test Conference (ITC) · 6
2021 · Natalia Lylina, Chih-Hao Wang, et al. · IEEE International Test Conference (ITC) · 4
2021 · Natalia Lylina, Ahmed Atteya, et al. · IEEE VLSI Test Symposium (VTS) · 4
2023 · Hans-Joachim Wunderlich, Hanieh Jafarzadeh, et al. · IEEE Latin American Test Symposium (LATS) · 2
2022 · Natalia Lylina, Chih-Hao Wang, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2
2023 · Payam Habiby, Natalia Lylina, et al. · IEEE European Test Symposium (ETS) · 1
2022 · Natalia Lylina, Chih-Hao Wang, et al. · Proceedings - Asian Test Symposium/Proceedings · 1
2022 · Natalia Lylina, Chih-Hao Wang, et al. · Design, Automation, and Test in Europe · 1
2022 · H. Amrouch, J. Anders, et al. · Design, Automation, and Test in Europe · 1
2024 · Wei-Ji Chao, Alexandra Kourfali, et al. · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
2023 · Natalia Lylina, Stefan Holst, et al. · IEEE International On-Line Testing Symposium (IOLTS)
2023 · Natalia Lylina, Stefan Holst, et al. · International Conference on Dependable Systems and Networks workshops
2022 · Natalia Lylina, Chih-Hao Wang, et al. · Journal of Electronic Testing
Works count: 17
Citation count: 50
H-index: 4
I10-index: 1
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