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Manas Kumar Parai
Observed names:
M. Parai,
Manas Parai,
Parai Manas
Observed institution:
Indian Institute of Engineering Science and Technology, Shibpur
ORCID:
0000-0003-3659-5408
Observed ORCID:
0000-0003-3659-5408
OpenAlex ID:
A5085085013
Multi-source data fusion technique for parametric fault diagnosis in analog circuits
2022
·
Manas Parai
, Supriyo Srimani
, et al.
·
Integration
·
34
A Statistical Approach of Analog Circuit Fault Detection Utilizing Kolmogorov–Smirnov Test Method
2020
·
Supriyo Srimani
, Manas Parai
, et al.
·
Circuits Systems and Signal Processing
·
27
Parametric fault detection of analog circuits based on Bhattacharyya measure
2017
·
Supriyo Srimani
, Manas Kumar Parai
, et al.
·
Analog Integrated Circuits and Signal Processing
·
18
Analog Circuit Fault Detection by Impulse Response-Based Signature Analysis
2020
·
Manas Parai
, Supriyo Srimani
, et al.
·
Circuits Systems and Signal Processing
·
16
Influence on Characteristics of RTD Due to Variation of Different Parameters and Material Properties
2017
·
Banasree Das
, Manas Kumar Parai
·
International Journal of High Speed Electronics and Systems
·
6
Fault detection of continuous time filter using nonlinear feedback based OBIST
2015
·
Manas Kumar Parai
, Kasturi Ghosh
, et al.
·
International Conference on Computers and Devices for Communication
·
3
Effects on I-V characteristics of RTD due to different parametric variations
2017
·
Das Banasree
, Parai Manas
, et al.
·
Devices for Integrated Circuit (DevIC)
·
2
Distortion Analysis and Fault Detection in Weakly Non-linear Analog Circuits Using Simplified Volterra Series Method
2024
·
Manas Kumar Parai
, Banasree Das
·
Procedia Computer Science
Experimental Verification of a New Oscillation-based Test Algorithm for Analog Circuits
2021
·
M. Parai
, S. Srimani
, et al.
·
IETE Journal of Research
Fusion of Information for Fault Diagnosis in Analog Circuits
2020
·
M. Parai
, K. Ghosh
, et al.
·
IEEE India Conference
Potentiality of Data Fusion in Analog Circuit Fault Diagnosis
2020
·
M. Parai
, K. Ghosh
, et al.
·
Proceedings - Asian Test Symposium/Proceedings
Distortion Analysis Using Volterra Kernel for Amplifier Circuits
2019
·
Supriyo Srimani
, Ravi Singh
, et al.
·
IEEE International Symposium on Smart Electronic Systems (iSES)
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Works count:
13
Citation count:
106
H-index:
5
I10-index:
4
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