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James E. Murguia

Observed names: Edward Murguia James, J. E. Murguia, J. Murguia, J.E. Murguia, Murguia, J., Murguia, J. E., Murguia, James E.
OpenAlex ID: A5085606905
Short-time failure of metal interconnect caused by current pulses
1993 · J.E. Murguia, J.B. Bernstein · IEEE Electron Device Letters · 43
Use of focused-ion-beam and modeling to optimize submicron MOSFET characteristics
1998 · Chih-Chieh Shen, J. Murguia, et al. · IEEE Transactions on Electron Devices · 29
Compact visible/near-infrared hyperspectral imager
2000 · James E. Murguia, Toby D. Reeves, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 28
Evaluation of a PtSi infrared camera
1990 · James E. Murguia, Jonathan M. Mooney, et al. · Optical Engineering · 15
Increase in silicon charge coupled devices speed with focused ion beam implanted channels
1991 · J. E. Murguia, M. I. Shepard, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 10
Performance analysis of a thermionic thermal detector at 400 K, 300 K, and 200 K
1999 · James E. Murguia, Prabha K. Tedrow, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
Comparison of infrared detection mechanisms in thermal-emissive vs. photoemissive silicon Schottky barrier arrays
2000 · Freeman D. Shepherd, James E. Murguia · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
Improved drift in two-phase, long-channel, shallow buried-channel CCDs with longitudinally nonuniform storage-gate implants
1992 · A.L. Lattes, S.C. Munroe, et al. · IEEE Transactions on Electron Devices · 5
Statistical Characterization Of A Large PtSi Focal Plane Array
1987 · James E. Murguia, William S. Ewing · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
Pseudo-imaging the spectral-temporal evolution of energetic transient events
2005 · Melanie M. Weeks, James E. Murguia, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
Application of Schottky barrier bolometer arrays to cooled sensors
2000 · Freeman D. Shepherd, James E. Murguia · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
Merging focused ion beam patterning and optical lithography in device and circuit fabrication
1990 · James E. Murguia, Christian R. Musil, et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 3
Diagnostics On A PtSi Infrared Imaging Array
1988 · J. E. Murguia, J. M. Mooney, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3
SWIR variable dispersion spectral imaging sensor
2007 · F. D. Shepherd, J. M. Mooney, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
Variable aperture lucky look approach to imaging through deep turbulence
2018 · James E. Murguia, Jonathan M. Mooney · 1
Novel focal plane array integration technology for use in eye-safe imaging ladar receivers
2001 · Kenneth Vaccaro, Stephen M. Spaziani, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
Improved cell design for Schottky barrier infrared detector arrays
1995 · Freeman D. Shepherd, Jonathan M. Mooney, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1
GaN Devices for High-Efficiency High Power X-Band Radar Performance
2004 · William Stacey, Phillip Lamarre, et al. · AIAA International Energy Conversion Engineering Conference (IECEC)
The application of focused ion beam implantation to the design and fabrication of MOS devices
1991 · Edward Murguia James
Schottky base edge leakage in Si permeable-base transistors
1987 · J.E. Murguia · IEEE Transactions on Electron Devices
Focused Ion Beam Fabrication
1987 · J. Melngailis, James E. Murguia, et al. · DSpace@MIT (Massachusetts Institute of Technology)
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Works count: 25
Citation count: 164
H-index: 6
I10-index: 5
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